Search results

  1. 1.
    0459102 - ÚPT 2017 RIV HR eng M - Monography Chapter
    Frank, Luděk
    Scanning Electron Microscopy with a Retarded Primary Beam.
    Modern Electron Microscopy in Physical and Life Sciences. Rijeka: InTech, 2016 - (Janeček, M.; Král, R.), s. 49-78. ISBN 978-953-51-2252-4
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : scanning electron microscopy * scanning transmission electron microscopy * slow electrons * electron microscopy of materials * biomedical eletron microscopy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0259355
     
     
  2. 2.
    0205712 - UPT-D 20030095 RIV US eng M - Monography Chapter
    Müllerová, Ilona - Frank, Luděk
    Scanning low energy electron microscopy.
    Advances in imaging and electron physics Vol. 128. New York: Elesevier Science, 2003 - (Hawkes, P.), s. 309 - 443
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : scanning electron microscope * low energy SEM * low energy electron beams
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0101325
     
     
  3. 3.
    0205556 - UPT-D 20020106 RIV US eng M - Monography Chapter
    Frank, Luděk
    Advances in scanning electron microscopy.
    Advances in Imaging and Electron Physics., s. 327 - 373
    R&D Projects: GA ČR GA202/99/0008
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : scanning electron microscopy * electron optics * instrumens for study of surfaces
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0101169
     
     
  4. 4.
    0204858 - UPT-D 960099 RIV CZ cze M - Monography Chapter
    Frank, Luděk - Eckertová, L. (ed.) - Frank, L. (ed.)
    Klasické metody analytické elektronové mikroskopie: zobrazování Augerovými elektrony a charakteristickým rtg zářením.
    Praha: Academia, 1996. ISBN 80-200-0329-0. In: Metody analýzy povrchů - Elektronová mikroskopie a difrakce., s. 93-157
    Permanent Link: http://hdl.handle.net/11104/0100478
     
     
  5. 5.
    0094363 - ÚPT 2008 RIV ES eng M - Monography Chapter
    Müllerová, Ilona - Frank, Luděk
    Very Low Energy Scanning Electron Microscopy.
    [Rastrovací elektronová mikroskopie na velmi nízkých energiích.]
    Modern Research and Educational Topics in Microscopy. Vol. 2. Badajoz: Formatex, 2007 - (Méndez-Vilas, A.; Diaz, J.), s. 795-804. Microscopy series, 3. ISBN 978-84-611-9420-9
    R&D Projects: GA ČR GA102/05/2327; GA ČR GA202/04/0281
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : electron optics * scanning electron microscopy * low energy electrons * cathode lens mode * surfaces
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0154189