Search results
- 1.0546409 - ÚPT 2022 RIV CH eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Piňos, Jakub - Průcha, Lukáš - Radlička, Tomáš - Werner, W. S. M. - Mikmeková, Eliška
Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer.
Nanomaterials. Roč. 11, č. 9 (2021), č. článku 2435. ISSN 2079-4991. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time-of-flight spectrometer * inelastic mean free path * density-functional theory * many-body perturbation theory * energy-loss spectrum * density of states * band structure * graphene
OECD category: Electrical and electronic engineering
Impact factor: 5.719, year: 2021
Method of publishing: Open access
https://www.mdpi.com/2079-4991/11/9/2435
Permanent Link: http://hdl.handle.net/11104/0322930
Research data: Zenodo - 2.0536755 - ÚPT 2021 RIV US eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : spectroscopy * very low energy electron transmission * 2D materials
OECD category: Electrical and electronic engineering
Impact factor: 4.127, year: 2020
Method of publishing: Open access
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41
Permanent Link: http://hdl.handle.net/11104/0314644 - 3.0525529 - ÚPT 2021 RIV NL eng J - Journal Article
Materna Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0368204818302068
Permanent Link: http://hdl.handle.net/11104/0309642 - 4.0525062 - ÚPT 2021 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
Acquisition of the dopant contrast in semiconductors with slow electrons.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S036820481830135X
Permanent Link: http://hdl.handle.net/11104/0309284 - 5.0489596 - ÚPT 2019 RIV NL eng J - Journal Article
Walker, Christopher - Konvalina, Ivo - Mika, Filip - Frank, Luděk - Müllerová, Ilona
Quantitative comparison of simulated and measured signals in the STEM mode of a SEM.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 415, JAN (2018), s. 17-24. ISSN 0168-583X. E-ISSN 1872-9584
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : low-energy electrons * multiple scattering * elastic-scattering * transmission
OECD category: Coating and films
Impact factor: 1.210, year: 2018
Permanent Link: http://hdl.handle.net/11104/0283980 - 6.0481766 - ÚPT 2018 RIV CZ cze J - Journal Article
Piňos, Jakub - Mikmeková, Eliška - Mikmeková, Šárka - Müllerová, Ilona - Frank, Luděk
Mikroskopie velmi pomalými elektrony v ultrazvukovém vakuu.
[Very slow electrons microscope in ultrahigh vacuum.]
Jemná mechanika a optika. Roč. 62, č. 10 (2017), s. 264-265. ISSN 0447-6441
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : scanning microscopy * slow electrons * ultrahigh vacuum * graphene
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0277308 - 7.0477097 - ÚPT 2018 RIV GB eng J - Journal Article
Piňos, Jakub - Mikmeková, Šárka - Frank, Luděk
About the information depth of backscattered electron imaging.
Journal of Microscopy. Roč. 266, č. 3 (2017), s. 335-342. ISSN 0022-2720. E-ISSN 1365-2818
Institutional support: RVO:68081731
Keywords : backscattered electrons * information depth * penetration of electrons
OECD category: Materials engineering
Impact factor: 1.693, year: 2017
Permanent Link: http://hdl.handle.net/11104/0273494 - 8.0474781 - ÚPT 2018 RIV NL eng J - Journal Article
Frank, Luděk - Mikmeková, Eliška - Lejeune, M.
Treatment of surfaces with low-energy electrons.
Applied Surface Science. Roč. 407, JUN 15 (2017), s. 105-108. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : Low-energy electrons * Electron beam induced release * Graphene * Ultimate cleaning of surfaces
OECD category: Nano-processes (applications on nano-scale)
Impact factor: 4.439, year: 2017
Permanent Link: http://hdl.handle.net/11104/0271732 - 9.0467245 - ÚPT 2017 RIV US eng J - Journal Article
Walker, C. - Frank, Luděk - Müllerová, Ilona
Simulations and measurements in scanning electron microscopes at low electron energy.
Scanning. Roč. 38, č. 6 (2016), s. 802-818. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : Monte Carlo modeling * scanned probe * computer simulation * electron-solid interactions * surface analysis
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.345, year: 2016
Permanent Link: http://hdl.handle.net/11104/0265392 - 10.0465457 - ÚPT 2017 RIV US eng J - Journal Article
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk
Practical Use of Scanning Low Energy Electron Microscope (SLEEM).
Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 1650-1651. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning low energy * SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.891, year: 2016
Permanent Link: http://hdl.handle.net/11104/0264011