Search results

  1. 1.
    0546409 - ÚPT 2022 RIV CH eng J - Journal Article
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Piňos, Jakub - Průcha, Lukáš - Radlička, Tomáš - Werner, W. S. M. - Mikmeková, Eliška
    Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer.
    Nanomaterials. Roč. 11, č. 9 (2021), č. článku 2435. E-ISSN 2079-4991
    R&D Projects: GA TA ČR(CZ) TN01000008
    Grant - others: AV ČR(CZ) StrategieAV21/6
    Program: StrategieAV
    Institutional support: RVO:68081731
    Keywords : time-of-flight spectrometer * inelastic mean free path * density-functional theory * many-body perturbation theory * energy-loss spectrum * density of states * band structure * graphene
    OECD category: Electrical and electronic engineering
    Impact factor: 5.076, year: 2020
    Method of publishing: Open access
    https://www.mdpi.com/2079-4991/11/9/2435
    Permanent Link: http://hdl.handle.net/11104/0322930
     

    Research data: Zenodo
     
  2. 2.
    0536755 - ÚPT 2021 RIV US eng J - Journal Article
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
    Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : spectroscopy * very low energy electron transmission * 2D materials
    OECD category: Electrical and electronic engineering
    Impact factor: 4.127, year: 2020
    Method of publishing: Open access
    https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41
    Permanent Link: http://hdl.handle.net/11104/0314644
     
     
  3. 3.
    0525529 - ÚPT 2021 RIV NL eng J - Journal Article
    Materna-Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
    Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
    Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
    OECD category: Electrical and electronic engineering
    Impact factor: 1.957, year: 2020
    Method of publishing: Open access
    https://www.sciencedirect.com/science/article/pii/S0368204818302068
    Permanent Link: http://hdl.handle.net/11104/0309642
     
     
  4. 4.
    0525062 - ÚPT 2021 RIV NL eng J - Journal Article
    Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
    Acquisition of the dopant contrast in semiconductors with slow electrons.
    Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
    OECD category: Electrical and electronic engineering
    Impact factor: 1.957, year: 2020
    Method of publishing: Open access
    https://www.sciencedirect.com/science/article/pii/S036820481830135X
    Permanent Link: http://hdl.handle.net/11104/0309284
     
     
  5. 5.
    0489596 - ÚPT 2019 RIV NL eng J - Journal Article
    Walker, Christopher - Konvalina, Ivo - Mika, Filip - Frank, Luděk - Müllerová, Ilona
    Quantitative comparison of simulated and measured signals in the STEM mode of a SEM.
    Nuclear Instruments & Methods in Physics Research Section B. Roč. 415, JAN (2018), s. 17-24. ISSN 0168-583X. E-ISSN 1872-9584
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : low-energy electrons * multiple scattering * elastic-scattering * transmission
    OECD category: Coating and films
    Impact factor: 1.210, year: 2018
    Permanent Link: http://hdl.handle.net/11104/0283980
     
     
  6. 6.
    0481766 - ÚPT 2018 RIV CZ cze J - Journal Article
    Piňos, Jakub - Mikmeková, Eliška - Mikmeková, Šárka - Müllerová, Ilona - Frank, Luděk
    Mikroskopie velmi pomalými elektrony v ultrazvukovém vakuu.
    [Very slow electrons microscope in ultrahigh vacuum.]
    Jemná mechanika a optika. Roč. 62, č. 10 (2017), s. 264-265. ISSN 0447-6441
    R&D Projects: GA MŠk(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : scanning microscopy * slow electrons * ultrahigh vacuum * graphene
    OECD category: Materials engineering
    Permanent Link: http://hdl.handle.net/11104/0277308
     
     
  7. 7.
    0477097 - ÚPT 2018 RIV GB eng J - Journal Article
    Piňos, Jakub - Mikmeková, Šárka - Frank, Luděk
    About the information depth of backscattered electron imaging.
    Journal of Microscopy. Roč. 266, č. 3 (2017), s. 335-342. ISSN 0022-2720. E-ISSN 1365-2818
    Institutional support: RVO:68081731
    Keywords : backscattered electrons * information depth * penetration of electrons
    OECD category: Materials engineering
    Impact factor: 1.693, year: 2017
    Permanent Link: http://hdl.handle.net/11104/0273494
     
     
  8. 8.
    0474781 - ÚPT 2018 RIV NL eng J - Journal Article
    Frank, Luděk - Mikmeková, Eliška - Lejeune, M.
    Treatment of surfaces with low-energy electrons.
    Applied Surface Science. Roč. 407, JUN 15 (2017), s. 105-108. ISSN 0169-4332. E-ISSN 1873-5584
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : Low-energy electrons * Electron beam induced release * Graphene * Ultimate cleaning of surfaces
    OECD category: Nano-processes (applications on nano-scale)
    Impact factor: 4.439, year: 2017
    Permanent Link: http://hdl.handle.net/11104/0271732
     
     
  9. 9.
    0467245 - ÚPT 2017 RIV US eng J - Journal Article
    Walker, C. - Frank, Luděk - Müllerová, Ilona
    Simulations and measurements in scanning electron microscopes at low electron energy.
    Scanning. Roč. 38, č. 6 (2016), s. 802-818. ISSN 0161-0457. E-ISSN 1932-8745
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : Monte Carlo modeling * scanned probe * computer simulation * electron-solid interactions * surface analysis
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.345, year: 2016
    Permanent Link: http://hdl.handle.net/11104/0265392
     
     
  10. 10.
    0465457 - ÚPT 2017 RIV US eng J - Journal Article
    Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk
    Practical Use of Scanning Low Energy Electron Microscope (SLEEM).
    Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 1650-1651. ISSN 1431-9276. E-ISSN 1435-8115
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : scanning low energy * SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.891, year: 2016
    Permanent Link: http://hdl.handle.net/11104/0264011