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  1. 1.
    0460178 - ÚFP 2017 RIV cze P - Patent Document
    Brožek, Vlastimil - Matějíček, Jiří - Neufuss, Karel
    Způsob přípravy wolframových a wolframkarbidových filtrů k filtracím za vysokých teplot.
    [High temperature tungsten and tungsten carbide filters fabrication.]
    2014. Owner: Ústav fyziky plazmatu Akademie věd České republiky, v. v. i. Date of the patent acceptance: 02.07.2014. Patent Number: 304629
    R&D Projects: GA ČR(CZ) GA104/05/0540
    Institutional support: RVO:61389021
    Keywords : tungsten filters * tungsten carbide filters * spheroidization * plasma spraying
    OECD category: Materials engineering
    https://isdv.upv.cz/webapp/webapp.pts.det?xprim=979502&lan=cs&s_majs=&s_puvo=&s_naze=Zp%C5%AFsob%20p%C5%99%C3%ADpravy%20wolframov%C3%BDch%20a%20wolframkarbidov%C3%BDch%20filtr%C5%AF%20k%20filtrac%C3%ADm%20za%20vysok%C3%BDch%20teplot&s_anot=
    Permanent Link: http://hdl.handle.net/11104/0260297
    FileDownloadSizeCommentaryVersionAccess
    0460178_patent_304629_Brozek_Matejicek.pdf0185.5 KBPublisher’s postprintrequire
     
     
  2. 2.
    0386657 - ÚFP 2013 RIV cze P - Patent Document
    Neufuss, Karel - Brožek, Vlastimil - Matějíček, Jiří
    Ochranný povlak na bázi wolframu a způsob jeho přípravy.
    [Protective tungsten-based coating and method of its preparation.]
    2012. Owner: Ústav fyziky plazmatu AV ČR, v.v.i. Date of the patent acceptance: 25.07.2012. Patent Number: 303411
    Institutional research plan: CEZ:AV0Z20430508
    Keywords : plasma spraying * tungsten * tungsten carbide * plasma sprayed coating
    Subject RIV: JK - Corrosion ; Surface Treatment of Materials
    http://spisy.upv.cz/Patents/FullDocuments/303/303411.pdf
    Permanent Link: http://hdl.handle.net/11104/0215947
     
     
  3. 3.
    0179050 - UFP-V 20020067 US eng P - Patent Document
    Sampath, S. - Matějíček, Jiří
    Method and Apparatus for Determining Process-Induced Stresses and Modulus of Coatings by in-situ Measurement.
    Stony Brook, NY, US: The Research Foundation of State University of New York, 2002. 20000303. Date of the patent acceptance: 20021112. 12 s. Patent Number: 6478875
    Institutional research plan: CEZ:AV0Z2043910
    Keywords : determining process
    Subject RIV: JB - Sensors, Measurment, Regulation
    Permanent Link: http://hdl.handle.net/11104/0075863
     
     


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