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- 1.0458106 - FZÚ 2016 RIV CZ eng V - Research Report
Vaněček, Milan - Holovský, Jakub - Poruba, Aleš - Remeš, Zdeněk - Purkrt, Adam
Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass.
Praha: Tel Solar AG, Trübbach, Switzerland, 2015. 22 s.
Source of funding: N - Non-public resources
Keywords : optical properties * amorphous silicon * microcrystalline silicon * ZnO
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0258426