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- 1.0585608 - FZÚ DATA Scientific data 2024
Correa, Cinthia Antunes - Chevalier, Joris More - Hruška, Petr - Poupon, Morgane - Novotný, Michal - Minárik, P. - Hubík, Pavel - Lukáč, František - Fekete, Ladislav - Prokop, Dejan - Hanuš, J. - Valenta, J. - Fitl, Přemysl - Lančok, Ján
Dataset related to the microstructure and physical properties of black aluminum antireflective films.
Description: The files are related to the manuscript „Microstructure and physical properties of Black-Aluminum antireflective films“ and are organized in the sequence of appearance in the manuscript. The nomenclature of the files follows the sequence:
Figure, number of the figure appearing in the manuscript (from 1 – 7), type of data (XRD, AFM, TEM, EDX, PALS, Reflectance, Carrier concentration, Electrical mobility, or resistivity), thin film sample related to (R-Al or B-Al), film thickness (60, 180, 250, 320, or 410 nm).
TEM image files are raw, as collected, while the ones in the manuscript were cropped to show the differences between the films.
Keywords : powder x-ray diffraction * atomic force microscopy * transmission electron microscopy * energy dispersive x-ray analysis * positron annihilation spectroscopy * reflectivity, resistivity * hall measurements
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
DOI: https://doi.org/10.57680/asep.0585608
Handle: https://hdl.handle.net/11104/0353281
Depositor: admin
Date of release: 2.5.2024
ASEP publication:
Microstructure and physical properties of black-aluminum antireflective films
License: CC BY 4.0 - Attribution-International license
File Download Size Commentary Access Data.zip File list 2 47.5 MB open-access R&D Projects: GA ČR GA23-05002S; GA MŠMT(CZ) EH22_008/0004596; GA MŠMT LM2023051
Institutional support: RVO:68378271Institutional support: RVO:61389021 - 2.0585551 - FZÚ DATA Scientific data 2024
Irimiciuc, Stefan - Grumezescu, V. - Holban, A. M. - Gherasim, O. - Chertopalov, Sergii - Garoi, P. - Craciun, V. - Lančok, Ján
Data files related to „Silver oxide phase tailoring for improved antimicrobial activity“.
Description: This data sheets contain This dataset contains data from morphological and structural analysis of pulsed laser deposited silver oxide thin films and their antibacterial behavior.
File 1. Scanning electron microscopy images of AgxO films produced by pulsed laser deposition deposited in O2 at 0.01 Pa (a), 0.1 Pa(b) and 1 Pa (c). The images were recorded using a magnification of 100 000 x.
File 2. Optical transmission spectra in the 300-800 nm range of the AgxO films containing different oxide phases (a) and the corresponding Tauc plots (b) recalculated using the Tauc plot method
File 3. X-ray diffraction patterns in the 20 -80 degrees range for the AgxO films deposited in 0.01, 0.1 and 1 Pa or O2 and the Photoelectron spectra recorded form the AgxO multiphase films as follows: in the 364-378 eV for the Ag3d peak and the 525-535 eV for the O1s peak.
File 4. Antibacterial activity of the AgxO films after 4 (a) and 24 hours (b) which depicts the evolution of Staphylococcus aureus and Escherichia coli bacteria population on the silver oxide films after the samples were intubated at 37 degrees for the two times that they were investigated.
Keywords : antimicrobial activity * silver oxide phase tailoring * pulsed laser deposition * x ray diffraction pattern
OECD category: Materials engineering
DOI: https://doi.org/10.57680/asep.0585551
Handle: https://hdl.handle.net/11104/0353279
Depositor: admin
Date of release: 30.4.2024
License: CC BY 4.0 - Attribution-International license
File Download Size Commentary Access data for Silver oxide phase tailoring for improved antimicrobial activity.zip File list 2 16.5 MB require R&D Projects: GA MŠMT(CZ) EH22_008/0004596
Institutional support: RVO:68378271