Search results
- 1.0501462 - FZÚ 2019 RIV CH eng M - Monography Chapter
Ondráček, Martin - Hapala, Prokop - Švec, Martin - Jelínek, Pavel
Imaging charge distribution within molecules by scanning probe microscopy.
Kelvin probe force microscopy. Cham: Springer International Publishing, 2018 - (Sadewasser, S.; Glatzel, T.), s. 499-518. Springer Series in Surface Sciences, 65. ISBN 978-3-319-75686-8
R&D Projects: GA ČR GJ17-24210Y
Grant - others:AV ČR(CZ) Praemium Academiae
Institutional support: RVO:68378271
Keywords : charge distribution * surfaces * molecules * Kelvin probe force microscopy * scanning quantum dot microscopy * high resolution atomic force microscopy
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Permanent Link: http://hdl.handle.net/11104/0293485 - 2.0471613 - FZÚ 2017 RIV SG eng M - Monography Chapter
Kůsová, Kateřina - Hapala, Prokop - Jelínek, Pavel - Pelant, Ivan
Band structure of silicon nanocrystals.
Silicon Nanophotonics. Basic Principles, Present Status, and Perspectives. Singapore: Pan Stanford Publishing, 2016 - (Khriachtchev, L.), s. 109-144. ISBN 978-981-4669-76-4
R&D Projects: GA ČR(CZ) GBP108/12/G108; GA ČR GPP204/12/P235; GA ČR(CZ) GA14-02079S
Institutional support: RVO:68378271
Keywords : silicon nanocrystals * band structure * luminescence properties
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0268973 - 3.0456656 - FZÚ 2016 RIV CH eng M - Monography Chapter
Jelínek, Pavel
Theoretical challenges of simultaneous nc-AFM/STM experiments.
Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy. Cham: Springer International Publishing, 2015 - (Moriarty, P.; Gauthi, S.), s. 81-92. Advances in Atom and Single Molecule Machines. ISBN 978-3-319-17400-6
R&D Projects: GA ČR(CZ) GA14-02079S
Institutional support: RVO:68378271
Keywords : AFM * STM * DFT simulations * electron transport * atomic contrast
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0257152 - 4.0456646 - FZÚ 2016 RIV CH eng M - Monography Chapter
Hapala, Prokop - Ondráček, Martin - Stetsovych, Oleksandr - Švec, Martin - Jelínek, Pavel
Simultaneous nc-AFM/STM measurements with atomic resolution.
Noncontact Atomic Force Microscopy. Cham: Springer International Publishing, 2015 - (Morita, S.; Giessibl, F.; Meyer, E.; Wiesendanger, R.), s. 29-49. NanoScience and Technology, 3. ISBN 978-3-319-15587-6
R&D Projects: GA ČR(CZ) GA14-02079S
Institutional support: RVO:68378271
Keywords : AFM * STM * DFT simulations * electron transport * atomic contrast
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0257148 - 5.0342573 - FZÚ 2011 RIV DE eng M - Monography Chapter
Pou, P. - Jelínek, Pavel - Pérez, R.
Basic mechanisms for single atom manipulation in semiconductor systems with the FM-AFM.
Noncontact Atomic Force Microscopy. Volume 2. Berlin: Springer, 2009 - (Morita, S.; Giessibl, F.; Wiesendanger, R.), s. 227-248. Nanoscience and Technology. ISBN 978-3-642-01494-9
R&D Projects: GA ČR GA202/09/0775; GA AV ČR IAA100100905
Institutional research plan: CEZ:AV0Z10100521
Keywords : AFM * DFT simulation * atomic manipulation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0185275