Search results
- 1.0511240 - FZÚ 2020 RIV NL eng M - Monography Chapter
Fejfar, Antonín - Rezek, Bohuslav - Čermák, Jan
Local current measurements.
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Amsterdam: Elsevier, 2018 - (Klapetek, P.), s. 265-301. Micro and Nano Technologies, 2nd edition. ISBN 978-0-12-813347-7
Institutional support: RVO:68378271
Keywords : atomic force microscopy * local current
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
https://www.sciencedirect.com/science/article/pii/B9780128133477000108?via%3Dihub
Permanent Link: http://hdl.handle.net/11104/0301569 - 2.0424738 - FZÚ 2014 RIV JP eng M - Monography Chapter
Fejfar, Antonín
Nano-level characterization of silicon thin films and solar cells.
Solar Cell Technology Handbook. Tokyo: Ohmsha, 2013 - (Konagai, M.), s. 468-478. ISBN 978-4-274-21399-1
R&D Projects: GA MŠMT(CZ) LM2011026
Grant - others:AVČR(CZ) M100101217
Institutional support: RVO:68378271
Keywords : silicon * thin films * atomic force microscopy * photoresponse
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0230767 - 3.0423743 - FZÚ 2014 RIV GB eng M - Monography Chapter
Klapetek, P. - Fejfar, Antonín - Rezek, Bohuslav
Local current measurements.
Quantitative Data Processing in Scanning Probe Microscopy. Oxford: Elsevier, 2013 - (Klapetek, P.), s. 221-245. Micro and Nano Technologies. ISBN 978-1-4557-3058-2
R&D Projects: GA MŠMT(CZ) LM2011026
Institutional support: RVO:68378271
Keywords : STM * AFM * local electronic properties * nanostructures
Subject RIV: BM - Solid Matter Physics ; Magnetism
http://www.sciencedirect.com/science/book/9781455730582
Permanent Link: http://hdl.handle.net/11104/0229821 - 4.0131967 - FZU-D 980064 RIV GB eng M - Monography Chapter
Pelant, Ivan - Fejfar, Antonín - Kočka, Jan - Amato, G. (ed.) - Delerues, C. (ed.) - Von Bardeleben, H. J. (ed.)
Transport properties of porous silicon.
Berks: Gordon and Breach Sci. Publ., 1997. ISBN 90-5699-604-5. In: Structural and Optical Properties of Porous Silicon Nanostructures, Optoelectronic Properties of Semiconductors and Superlattices., s. 253-285
R&D Projects: GA AV ČR IAA1010528; GA ČR GA202/95/1445
Permanent Link: http://hdl.handle.net/11104/0030009