Search results
- 1.0525062 - ÚPT 2021 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
Acquisition of the dopant contrast in semiconductors with slow electrons.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S036820481830135X
Permanent Link: http://hdl.handle.net/11104/0309284 - 2.0395127 - ÚPT 2014 RIV GB eng J - Journal Article
Mikmeková, Eliška - Bouyanfif, H. - Lejeune, M. - Müllerová, Ilona - Hovorka, Miloš - Unčovský, M. - Frank, Luděk
Very low energy electron microscopy of graphene flakes.
Journal of Microscopy. Roč. 251, č. 2 (2013), s. 123-127. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : graphene * very low energy STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.150, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225233 - 3.0385193 - ÚPT 2013 RIV CH eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Mikmeková, Šárka - Mikmeková, Eliška - Müllerová, Ilona - Pokorná, Zuzana
Scanning Electron Microscopy with Samples in an Electric Field.
Materials. Roč. 5, č. 12 (2012), s. 2731-2756. E-ISSN 1996-1944
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning electron microscopy * slow electrons * low energy SEM * low energy STEM * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.247, year: 2012
Permanent Link: http://hdl.handle.net/11104/0214527 - 4.0383741 - ÚPT 2013 RIV NL eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
A method of imaging ultrathin foils with very low energy electrons.
Ultramicroscopy. Roč. 119, AUG (2012), s. 79-81. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : very low energy STEM * penetration of very slow electrons * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.470, year: 2012
Permanent Link: http://hdl.handle.net/11104/0213588 - 5.0379913 - ÚPT 2012 RIV US eng J - Journal Article
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Hovorka, Miloš - Frank, Luděk
Applications of the Scanning Low Energy Electron Microscope.
Microscopy and Microanalysis. Roč. 18, S2 (2012), s. 996-997. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MPO FR-TI3/323; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscope * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.495, year: 2012
Permanent Link: http://hdl.handle.net/11104/0210765 - 6.0375383 - ÚPT 2012 RIV GB eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Mika, Filip - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Very low energy scanning electron microscopy in nanotechnology.
International Journal of Nanotechnology. Roč. 9, 8/9 (2012), s. 695-716. ISSN 1475-7435. E-ISSN 1741-8151
R&D Projects: GA MŠMT OE08012; GA MŠMT ED0017/01/01; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * very low energy electrons * cathode lens * grain contrast * strain contrast * imaging of participates * dopant contrast * very low energy STEM * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.087, year: 2012
Permanent Link: http://hdl.handle.net/11104/0208054 - 7.0367773 - ÚPT 2012 RIV US eng J - Journal Article
Müllerová, Ilona - Mikmeková, Šárka - Hovorka, Miloš - Frank, Luděk
Unconventional Imaging with Backscattered Electrons.
Microscopy and Microanalysis. Roč. 17, Suppl. 2 (2011), s. 900-901. ISSN 1431-9276. E-ISSN 1435-8115
Institutional research plan: CEZ:AV0Z20650511
Keywords : SEM * low energies * grain contrast * dopant contrast * internal stress
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 3.007, year: 2011
Permanent Link: http://hdl.handle.net/11104/0202327 - 8.0367292 - ÚPT 2012 RIV US eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Konvalina, Ivo - Unčovský, M. - Frank, Luděk
Scanning transmission low-energy electron microscopy.
IBM Journal of Research and Development. Roč. 55, č. 4 (2011), 2:1-6. ISSN 0018-8646. E-ISSN 2151-8556
R&D Projects: GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : TEM * STEM * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.723, year: 2011
Permanent Link: http://hdl.handle.net/11104/0202028 - 9.0358595 - ÚPT 2012 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Konvalina, Ivo - Mikmeková, Šárka - Müllerová, Ilona
Very low energy scanning electron microscopy.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 46-54. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * low energy electrons * cathode lens * very low energy STEM * grain contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196580 - 10.0340747 - ÚPT 2010 RIV JP eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Hanzlíková, Renáta - Frank, Luděk
Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films.
Materials Transactions. Roč. 51, č. 2 (2010), s. 265-270. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : low energy scanning electron microscopy * thin foils * transmission of very slow electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.779, year: 2010
http://www.jim.or.jp/journal/e/51/02/265.html
Permanent Link: http://hdl.handle.net/11104/0183928