Search results

  1. 1.
    0525062 - ÚPT 2021 RIV NL eng J - Journal Article
    Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
    Acquisition of the dopant contrast in semiconductors with slow electrons.
    Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
    OECD category: Electrical and electronic engineering
    Impact factor: 1.957, year: 2020
    Method of publishing: Open access
    https://www.sciencedirect.com/science/article/pii/S036820481830135X
    Permanent Link: http://hdl.handle.net/11104/0309284
     
     
  2. 2.
    0395127 - ÚPT 2014 RIV GB eng J - Journal Article
    Mikmeková, Eliška - Bouyanfif, H. - Lejeune, M. - Müllerová, Ilona - Hovorka, Miloš - Unčovský, M. - Frank, Luděk
    Very low energy electron microscopy of graphene flakes.
    Journal of Microscopy. Roč. 251, č. 2 (2013), s. 123-127. ISSN 0022-2720. E-ISSN 1365-2818
    R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : graphene * very low energy STEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.150, year: 2013
    Permanent Link: http://hdl.handle.net/11104/0225233
     
     
  3. 3.
    0385193 - ÚPT 2013 RIV CH eng J - Journal Article
    Frank, Luděk - Hovorka, Miloš - Mikmeková, Šárka - Mikmeková, Eliška - Müllerová, Ilona - Pokorná, Zuzana
    Scanning Electron Microscopy with Samples in an Electric Field.
    Materials. Roč. 5, č. 12 (2012), s. 2731-2756. E-ISSN 1996-1944
    R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : scanning electron microscopy * slow electrons * low energy SEM * low energy STEM * cathode lens
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.247, year: 2012
    Permanent Link: http://hdl.handle.net/11104/0214527
     
     
  4. 4.
    0383741 - ÚPT 2013 RIV NL eng J - Journal Article
    Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
    A method of imaging ultrathin foils with very low energy electrons.
    Ultramicroscopy. Roč. 119, AUG (2012), s. 79-81. ISSN 0304-3991. E-ISSN 1879-2723
    R&D Projects: GA AV ČR IAA100650902; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : very low energy STEM * penetration of very slow electrons * graphene
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.470, year: 2012
    Permanent Link: http://hdl.handle.net/11104/0213588
     
     
  5. 5.
    0379913 - ÚPT 2012 RIV US eng J - Journal Article
    Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Hovorka, Miloš - Frank, Luděk
    Applications of the Scanning Low Energy Electron Microscope.
    Microscopy and Microanalysis. Roč. 18, S2 (2012), s. 996-997. ISSN 1431-9276. E-ISSN 1435-8115
    R&D Projects: GA MPO FR-TI3/323; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : scanning low energy electron microscope * cathode lens
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.495, year: 2012
    Permanent Link: http://hdl.handle.net/11104/0210765
     
     
  6. 6.
    0375383 - ÚPT 2012 RIV GB eng J - Journal Article
    Müllerová, Ilona - Hovorka, Miloš - Mika, Filip - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
    Very low energy scanning electron microscopy in nanotechnology.
    International Journal of Nanotechnology. Roč. 9, 8/9 (2012), s. 695-716. ISSN 1475-7435. E-ISSN 1741-8151
    R&D Projects: GA MŠk OE08012; GA MŠk ED0017/01/01; GA AV ČR IAA100650902
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning electron microscopy * very low energy electrons * cathode lens * grain contrast * strain contrast * imaging of participates * dopant contrast * very low energy STEM * graphene
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.087, year: 2012
    Permanent Link: http://hdl.handle.net/11104/0208054
     
     
  7. 7.
    0367773 - ÚPT 2012 RIV US eng J - Journal Article
    Müllerová, Ilona - Mikmeková, Šárka - Hovorka, Miloš - Frank, Luděk
    Unconventional Imaging with Backscattered Electrons.
    Microscopy and Microanalysis. Roč. 17, Suppl. 2 (2011), s. 900-901. ISSN 1431-9276. E-ISSN 1435-8115
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : SEM * low energies * grain contrast * dopant contrast * internal stress
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 3.007, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0202327
     
     
  8. 8.
    0367292 - ÚPT 2012 RIV US eng J - Journal Article
    Müllerová, Ilona - Hovorka, Miloš - Konvalina, Ivo - Unčovský, M. - Frank, Luděk
    Scanning transmission low-energy electron microscopy.
    IBM Journal of Research and Development. Roč. 55, č. 4 (2011), 2:1-6. ISSN 0018-8646. E-ISSN 2151-8556
    R&D Projects: GA AV ČR IAA100650902; GA MŠk ED0017/01/01
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : TEM * STEM * SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 0.723, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0202028
     
     
  9. 9.
    0358595 - ÚPT 2012 RIV NL eng J - Journal Article
    Frank, Luděk - Hovorka, Miloš - Konvalina, Ivo - Mikmeková, Šárka - Müllerová, Ilona
    Very low energy scanning electron microscopy.
    Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 46-54. ISSN 0168-9002. E-ISSN 1872-9576
    R&D Projects: GA MŠk OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning electron microscopy * low energy electrons * cathode lens * very low energy STEM * grain contrast
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.207, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0196580
     
     
  10. 10.
    0340747 - ÚPT 2010 RIV JP eng J - Journal Article
    Müllerová, Ilona - Hovorka, Miloš - Hanzlíková, Renáta - Frank, Luděk
    Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films.
    Materials Transactions. Roč. 51, č. 2 (2010), s. 265-270. ISSN 1345-9678. E-ISSN 1347-5320
    R&D Projects: GA AV ČR IAA100650902
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : low energy scanning electron microscopy * thin foils * transmission of very slow electrons
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 0.779, year: 2010
    http://www.jim.or.jp/journal/e/51/02/265.html
    Permanent Link: http://hdl.handle.net/11104/0183928