Search results
- 1.0387264 - ÚPT 2013 RIV GB eng C - Conference Paper (international conference)
Frank, Luděk - Mikmeková, Šárka - Hovorka, Miloš - Pokorná, Zuzana - Müllerová, Ilona
Overview of SEM developments and potential.
EMC 2012. Proceedings of the 15th European Microscopy Congress. vol. 2. Manchester: The Royal Microscopical Society, 2012, s. 121-122. ISBN 978-0-9502463-6-9.
[EMC 2012. European Microscopy Congress /15./. Manchester (US), 16.09.2012-21.09.2012]
R&D Projects: GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : low energy SEM * multichannel SEM * STEM in SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0216387 - 2.0386449 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk - Mikulík, P.
Mapping of dopants in silicon by electron injection.
Physic and Nanoscale. (Proceedings of the 10th IUVSTA International Summer School ). Praha: IOP AS CR, 2012 - (Fejfar, A.; Vetushka, A.). ISBN 978-80-260-0619-0.
[Physics at Nanoscale. IUVSTA International Summer School /10./. Devět skal (CZ), 30.05.2012-04.06.2012]
Institutional support: RVO:68081731
Keywords : mapping of dopants in sillicon * electron injection
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215756 - 3.0386448 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Mikulík, P. - Humlíček, J. - Hovorka, Miloš - Kulha, P. - Kadlec, F.
Education and research at clean room laboratory for silicon device technology at Masaryk University.
Physic and Nanoscale. (Proceedings of the 10th IUVSTA International Summer School ). Praha: IOP AS CR, 2012 - (Fejfar, A.; Vetushka, A.). ISBN 978-80-260-0619-0.
[Physics at Nanoscale. IUVSTA International Summer School /10./. Devět skal (CZ), 30.05.2012-04.06.2012]
Institutional support: RVO:68081731
Keywords : silicon device technology * education and research * clean room laboratory
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0215746 - 4.0379917 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk
Very Low Energy STEM and Imaging of Free-standing Foils.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 411:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy * cathode lens * transmitted electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210768 - 5.0379916 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Müllerová, Ilona - Konvalina, Ivo - Hovorka, Miloš - Mika, Filip
Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 410:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning electron microscopy * cathode lens * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210767 - 6.0368827 - ÚPT 2012 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Mikmeková, Šárka - Pokorná, Zuzana - Mikmeková, Eliška - Frank, Luděk
Scanning Very Low Energy Electron Microscopy.
NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, s. 238-243. ISBN 978-80-87294-27-7.
[NANOCON 2011. International Conference /3./. Brno (CZ), 21.09.2011-23.09.2011]
R&D Projects: GA ČR GAP108/11/2270; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * low energy electrons * grain contrast * transmitted electrons * dopant contrast * thin films
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0203060 - 7.0367893 - ÚPT 2012 RIV CH eng C - Conference Paper (international conference)
Mikmeková, Šárka - Man, O. - Pantělejev, L. - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk - Kouřil, M.
Strain Mapping by Scanning Low Energy Electron Microscopy.
Materials Structure and Micromechanics of Fracture VI (Key Engineering Materials Vol. 465). Zurich: Trans Tech Publications, 2011 - (Šandera, P.), s. 338-341. ISBN 978-3-03785-006-0. ISSN 1662-9795.
[MSMF-6: Materials Structure and Micromechanics of Fracture VI. Brno (CZ), 28.06.2010-30.06.2010]
R&D Projects: GA AV ČR IAA100650902; GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy (SLEEM) * contrast of crystal orientation * microscopic strain
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0202409 - 8.0367280 - ÚPT 2012 RIV DE eng C - Conference Paper (international conference)
Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk - Mikulík, P.
Mapping of dopants in silicon by injection of electrons.
MC 2011 - Microscopy Conference Kiel. Kiel: DGE, 2011, IM7.P198:1-2. ISBN 978-3-00-033910-3.
[MC 2011 - Microscopy Conference. Kiel (DE), 28.08.2011-02.09.2011]
R&D Projects: GA AV ČR IAA100650902; GA ČR GAP108/11/2270
Institutional research plan: CEZ:AV0Z20650511
Keywords : dopant * silicon * scanning electron microscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0202020 - 9.0367278 - ÚPT 2012 RIV DE eng C - Conference Paper (international conference)
Konvalina, Ivo - Hovorka, Miloš - Müllerová, Ilona
Electron optical properties of a focusing magnetic/immersion-magnetic lens combined with a cathode lens.
MC 2011 - Microscopy Conference Kiel. Kiel: DGE, 2011, IM1.112:1-2. ISBN 978-3-00-033910-3.
[MC 2011 - Microscopy Conference. Kiel (DE), 28.08.2011-02.09.2011]
R&D Projects: GA AV ČR IAA100650902; GA MPO FR-TI1/305; GA MPO FR-TI1/118
Institutional research plan: CEZ:AV0Z20650511
Keywords : cathode lens * aberration coefficients * spot size
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0202018 - 10.0367236 - ÚPT 2012 IT eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk
Examination of ultrathin films with slow electrons.
Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, s. 59-60.
[Multinational Congress on Microscopy 2011 /10./ - MCM 2011. Urbino (IT), 04.09.2011-09.09.2011]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : low energy electrons * scanning electron microscope * transmitted electrons * reflected electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0201982