Search results

  1. 1.
    0387264 - ÚPT 2013 RIV GB eng C - Conference Paper (international conference)
    Frank, Luděk - Mikmeková, Šárka - Hovorka, Miloš - Pokorná, Zuzana - Müllerová, Ilona
    Overview of SEM developments and potential.
    EMC 2012. Proceedings of the 15th European Microscopy Congress. vol. 2. Manchester: The Royal Microscopical Society, 2012, s. 121-122. ISBN 978-0-9502463-6-9.
    [EMC 2012. European Microscopy Congress /15./. Manchester (US), 16.09.2012-21.09.2012]
    R&D Projects: GA ČR GAP108/11/2270
    Institutional support: RVO:68081731
    Keywords : low energy SEM * multichannel SEM * STEM in SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0216387
     
     
  2. 2.
    0386449 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
    Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk - Mikulík, P.
    Mapping of dopants in silicon by electron injection.
    Physic and Nanoscale. (Proceedings of the 10th IUVSTA International Summer School ). Praha: IOP AS CR, 2012 - (Fejfar, A.; Vetushka, A.). ISBN 978-80-260-0619-0.
    [Physics at Nanoscale. IUVSTA International Summer School /10./. Devět skal (CZ), 30.05.2012-04.06.2012]
    Institutional support: RVO:68081731
    Keywords : mapping of dopants in sillicon * electron injection
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0215756
     
     
  3. 3.
    0386448 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
    Mikulík, P. - Humlíček, J. - Hovorka, Miloš - Kulha, P. - Kadlec, F.
    Education and research at clean room laboratory for silicon device technology at Masaryk University.
    Physic and Nanoscale. (Proceedings of the 10th IUVSTA International Summer School ). Praha: IOP AS CR, 2012 - (Fejfar, A.; Vetushka, A.). ISBN 978-80-260-0619-0.
    [Physics at Nanoscale. IUVSTA International Summer School /10./. Devět skal (CZ), 30.05.2012-04.06.2012]
    Institutional support: RVO:68081731
    Keywords : silicon device technology * education and research * clean room laboratory
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0215746
     
     
  4. 4.
    0379917 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
    Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk
    Very Low Energy STEM and Imaging of Free-standing Foils.
    Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 411:1-2. ISBN 978-1-74052-245-8.
    [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
    R&D Projects: GA MPO FR-TI3/323
    Institutional support: RVO:68081731
    Keywords : scanning low energy electron microscopy * cathode lens * transmitted electrons
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0210768
     
     
  5. 5.
    0379916 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
    Müllerová, Ilona - Konvalina, Ivo - Hovorka, Miloš - Mika, Filip
    Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope.
    Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 410:1-2. ISBN 978-1-74052-245-8.
    [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
    R&D Projects: GA MPO FR-TI3/323
    Institutional support: RVO:68081731
    Keywords : scanning electron microscopy * cathode lens * secondary electrons * backscattered electrons
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0210767
     
     
  6. 6.
    0368827 - ÚPT 2012 RIV CZ eng C - Conference Paper (international conference)
    Müllerová, Ilona - Hovorka, Miloš - Mikmeková, Šárka - Pokorná, Zuzana - Mikmeková, Eliška - Frank, Luděk
    Scanning Very Low Energy Electron Microscopy.
    NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, s. 238-243. ISBN 978-80-87294-27-7.
    [NANOCON 2011. International Conference /3./. Brno (CZ), 21.09.2011-23.09.2011]
    R&D Projects: GA ČR GAP108/11/2270; GA AV ČR IAA100650902
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning electron microscopy * low energy electrons * grain contrast * transmitted electrons * dopant contrast * thin films
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0203060
     
     
  7. 7.
    0367893 - ÚPT 2012 RIV CH eng C - Conference Paper (international conference)
    Mikmeková, Šárka - Man, O. - Pantělejev, L. - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk - Kouřil, M.
    Strain Mapping by Scanning Low Energy Electron Microscopy.
    Materials Structure and Micromechanics of Fracture VI (Key Engineering Materials Vol. 465). Zurich: Trans Tech Publications, 2011 - (Šandera, P.), s. 338-341. ISBN 978-3-03785-006-0. ISSN 1662-9795.
    [MSMF-6: Materials Structure and Micromechanics of Fracture VI. Brno (CZ), 28.06.2010-30.06.2010]
    R&D Projects: GA AV ČR IAA100650902; GA MŠk OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning low energy electron microscopy (SLEEM) * contrast of crystal orientation * microscopic strain
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0202409
     
     
  8. 8.
    0367280 - ÚPT 2012 RIV DE eng C - Conference Paper (international conference)
    Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk - Mikulík, P.
    Mapping of dopants in silicon by injection of electrons.
    MC 2011 - Microscopy Conference Kiel. Kiel: DGE, 2011, IM7.P198:1-2. ISBN 978-3-00-033910-3.
    [MC 2011 - Microscopy Conference. Kiel (DE), 28.08.2011-02.09.2011]
    R&D Projects: GA AV ČR IAA100650902; GA ČR GAP108/11/2270
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : dopant * silicon * scanning electron microscopy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0202020
     
     
  9. 9.
    0367278 - ÚPT 2012 RIV DE eng C - Conference Paper (international conference)
    Konvalina, Ivo - Hovorka, Miloš - Müllerová, Ilona
    Electron optical properties of a focusing magnetic/immersion-magnetic lens combined with a cathode lens.
    MC 2011 - Microscopy Conference Kiel. Kiel: DGE, 2011, IM1.112:1-2. ISBN 978-3-00-033910-3.
    [MC 2011 - Microscopy Conference. Kiel (DE), 28.08.2011-02.09.2011]
    R&D Projects: GA AV ČR IAA100650902; GA MPO FR-TI1/305; GA MPO FR-TI1/118
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : cathode lens * aberration coefficients * spot size
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0202018
     
     
  10. 10.
    0367236 - ÚPT 2012 IT eng C - Conference Paper (international conference)
    Müllerová, Ilona - Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk
    Examination of ultrathin films with slow electrons.
    Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, s. 59-60.
    [Multinational Congress on Microscopy 2011 /10./ - MCM 2011. Urbino (IT), 04.09.2011-09.09.2011]
    R&D Projects: GA AV ČR IAA100650902
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : low energy electrons * scanning electron microscope * transmitted electrons * reflected electrons
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0201982