Search results

  1. 1.
    0371449 - ÚPT 2012 RIV PL eng A - Abstract
    Mikulík, P. - Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk
    Mapping of dopants in silicon by injection of electrons.
    28th European Conference on Surface Science. Wroclaw: University of Wroclaw, 2011. s. 188-189.
    [European Conference on Surface Science /28./. 28.08.2011-02.09.2011, Wroclaw]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : dopant * silicon * scanning electron microscopy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0204960
     
     
  2. 2.
    0353051 - ÚPT 2011 CN eng A - Abstract
    Konvalina, Ivo - Hovorka, Miloš - Fořt, Tomáš - Müllerová, Ilona
    Optical and scanning electron microscopies in examination of ultrathin foils.
    Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 224.
    [Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
    R&D Projects: GA AV ČR IAA100650902
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : very low energy electrons * laser confocal microscope * free-standing ultra thin films * very low energy transmission mode
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0192399
     
     
  3. 3.
    0352972 - ÚPT 2011 PL eng A - Abstract
    Mikulík, P. - Humlíček, J. - Kulha, P. - Hovorka, Miloš - Kadlec, Filip
    Education and research at clean room laboratory for silicon device technology at Masaryk University.
    XXXIX "Jaszowiec" International School and Conference on the Physics of Semiconductors. Warsaw: University of Warsaw, 2010. s. 242.
    ["Jaszowiec" International School and Conference on the Physics of Semiconductors /39./. 19.06.2010-24.06.2010, Krynica Zdroj]
    Institutional research plan: CEZ:AV0Z20650511; CEZ:AV0Z10100520
    Keywords : silicon * clean room * microelectronics laboratory
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Permanent Link: http://hdl.handle.net/11104/0192336
     
     
  4. 4.
    0352939 - ÚPT 2011 US eng A - Abstract
    Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
    Scanning transmission low energy electron microscopy.
    The 7th International Workshop on LEEM/PEEM. New York: IBM T.J. Watson Research Center, 2010. s. 25.
    [LEEM/PEEM /7./. 08.08.2010-13.08.2010, New York]
    R&D Projects: GA AV ČR IAA100650902
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning electron microscope * he low energy electron microscope * graphene
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0192317
     
     
  5. 5.
    0335882 - ÚPT 2011 IT eng A - Abstract
    Hovorka, Miloš - Mikmeková, Šárka - Frank, Luděk
    Scanning low energy electron microscopy of doped silicon at units of eV.
    6th International Workshop on LEEM/PEEM. Trieste: ELETTRA, 2008. s. 110. ISBN N.
    [International Workshop on LEEM/PEEM /6./. 07.09.2008-11.09.2008, Trieste]
    R&D Projects: GA AV ČR IAA100650803
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : very low energy electron microscopy * scanning low energy electron microscope
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0180232
     
     
  6. 6.
    0335497 - ÚPT 2010 CZ eng A - Abstract
    Hovorka, Miloš - Mika, Filip - Frank, Luděk
    Profiling N-Type Dopants in Silicon Structures.
    Mikroskopia 2009. Brno: Tribun EU, 2009. s. 25. ISBN 978-80-7399-739-7.
    [Mikroskopia 2009. 25.03.2009-26.03.2009, Stará Lesná]
    R&D Projects: GA ČR GP102/09/P543; GA AV ČR IAA100650803
    Institutional research plan: CEZ:AV0Z20650511
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0179946
     
     
  7. 7.
    0335494 - ÚPT 2010 CZ eng A - Abstract
    Müllerová, Ilona - Hovorka, Miloš - Hanzlíková, Renáta - Frank, Luděk
    Low Energy Electron Transmission through Thin Films by SEM.
    Mikroskopia 2009. Brno: Tribun EU, 2009. s. 10. ISBN 978-80-7399-739-7.
    [Mikroskopia 2009. 25.03.2009-26.03.2009, Stará Lesná]
    R&D Projects: GA AV ČR IAA100650902
    Grant - others: EC 6FP(XE) NEST-2004-ADV-28326
    Institutional research plan: CEZ:AV0Z20650511
    Source of funding: R - Framework programmes of European Commission
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0179943
     
     
  8. 8.
    0335493 - ÚPT 2010 CZ eng A - Abstract
    Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk - Man, O. - Pantělejev, L.
    Study of the Microstructure of UFG Copper in UHV SLEEM.
    Mikroskopia 2009. Brno: Tribun EU, 2009. s. 8. ISBN 978-80-7399-739-7.
    [Mikroskopia 2009. 25.03.2009-26.03.2009, Stará Lesná]
    R&D Projects: GA MŠk OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0179942