Search results
- 1.0352541 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Jirák, J. - Runštuk, Jiří - Špinka, J.
Problems of "in situ" specimen observation in ESEM.
11th Advanced Batteries, Accumulators and Fuel Cells. Brno: Brno University of Technology, 2010, s. 85-86. ISBN 978-80-214-4148-4.
[Advanced Batteries, Accumulators and Fuel Cells /11./ - ABAF. Brno (CZ), 19.09.2010-22.09.2010]
R&D Projects: GA ČR GA102/09/0314
Institutional research plan: CEZ:AV0Z20650511
Keywords : ESEM * agressive specimen * in-situ observation.
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192030 - 2.0335264 - ÚPT 2011 RIV AT eng C - Conference Paper (international conference)
Horodysky, P. - Jiruse, J. - Neděla, Vilém - Špinka, J.
Properties of modern scintillators compared by nuclear and elektron microscopy methods.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 207. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
Institutional research plan: CEZ:AV0Z20650511
Keywords : SEM * scintillator * detection efficiency
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0179774 - 3.0315080 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
Jirák, Josef - Černoch, P. - Neděla, Vilém - Špinka, J.
Scintillation SE Detector for Variable Pressure Scanning Electron Microscope.
[Scintilační detektor sekundárních elektronů pro vysokotlaký rastrovací elektronový mikroskop.]
EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 559-560. ISBN 978-3-540-85154-7.
[EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : VPSEM * secondary electrons detector * scintillatíon detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0004851 - 4.0204997 - UPT-D 980028 RIV MX eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, J. - Klvač, Martin - Špinka, J.
Detection of BSE signal at higher pressures in the specimen chamber.
Proceedings of the 14th International Congress on Electron Microscopy. Bristol: Institute of Physics Publishing Ltd., 1998 - (Benavides, H.; Yacamán, M.), s. 509-510. ISBN 0-7503-0568-1.
[ICEM /14./ - International Congress on Electron Microscopy. Cancun (MX), 31.08.1998-04.09.1998]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100617 - 5.0204980 - UPT-D 980008 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, J. - Michálek, M. - Špinka, J.
Conditions for Specimen Observation in Environmental SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 6th Seminar. Brno: Czechoslovak Society for Electron Microscopy, 1998 - (Müllerová, I.; Frank, L.), s. 15-16. ISBN 80-238-2333-7.
[Recent Trends /6./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 29.06.1998-03.07.1998]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100600 - 6.0204979 - UPT-D 980007 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, J. - Michálek, M. - Špinka, J.
Amplification of Signal Electrons in Gas Environment.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 6th Seminar. Brno: Czechoslovak Society for Electron Microscopy, 1998 - (Müllerová, I.; Frank, L.), s. 13-14. ISBN 80-238-2333-7.
[Recent Trends /6./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 29.06.1998-03.07.1998]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100599 - 7.0204967 - UPT-D 970103 CZ cze C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, J. - Špinka, J.
Využití ESEM v diagnostice elektrotechnických materiálů.
Mezinárodní konference Diagnostika '97. Plzeň: Západočeská univerzita v Plzni, 1997, s. 225-227. ISBN 80-7082-342-9.
[Diagnostika '97. Plzeň (CZ), 02.09.1997-04.09.1997]
Permanent Link: http://hdl.handle.net/11104/0100587 - 8.0204965 - UPT-D 970101 CZ cze C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, J. - Špinka, J.
Podmínky pozorování vzorků materiálů v ESEM.
Mezinárodní konference Diagnostika '97. Plzeň: Západočeská univerzita v Plzni, 1997, s. 220-222. ISBN 80-7082-342-9.
[Diagnostika '97. Plzeň (CZ), 02.09.1997-04.09.1997]
Permanent Link: http://hdl.handle.net/11104/0100585 - 9.0204959 - UPT-D 970095 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, J. - Špinka, J.
Detection of Signal Electrons in an Environmental Scanning Electron Microscope.
Proceedings of Workshop '97. Vol. 3. Praha: Czech Technical University, 1997, s. 1025-1026.
[Workshop '97 - Czech TU. Praha (CZ), 20.01.1997-22.01.1997]
R&D Projects: GA MŠMT VS460021
Permanent Link: http://hdl.handle.net/11104/0100579 - 10.0204955 - UPT-D 970091 RIV SI eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, J. - Romanovský, Vladimír - Špinka, J.
Signal detection in environmental SEM with ionisation detector.
Proceedings of the 3rd Multinational Congress on Electron Microscopy. Ljubljana: Jožef Stefan Institute, Ceramics Department, 1997, s. 289-290.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož (SI), 05.10.1997-08.10.1997]
Permanent Link: http://hdl.handle.net/11104/0100575