Search results
- 1.0575305 - ÚH 2024 CZ cze J - Journal Article
Procházka, J. - Šustková, V. - Jirák, J. - Tesař, Miroslav
Význam a problematika automatického měření sněhové pokrývky - studie pro oblast Šumavy.
[Significance and issues of automatic snow cover measurement - cas study for the Šumava Mountains region.]
Meteorologické zprávy. Roč. 76, č. 3 (2023), s. 73-83. ISSN 0026-1173
Grant - others:AV ČR(CZ) StrategieAV21/20
Program: StrategieAV
Institutional support: RVO:67985874
Keywords : snow depth * weather station * Šumava Mountains * climatological chart * automatic measurement of snow cover
OECD category: Meteorology and atmospheric sciences
https://www.chmi.cz/files/portal/docs/reditel/SIS/casmz/assets/2023/MZ_03_2023.pdf
Permanent Link: https://hdl.handle.net/11104/0345083 - 2.0385262 - ÚPT 2013 RIV CZ eng J - Journal Article
Maxa, J. - Neděla, Vilém - Jirák, J. - Vyroubal, P. - Hladká, K.
Analysis of gas flow in a secondary electron scintillation detector for ESEM with a new system of pressure limiting apertures.
Advances in Military Technology. Roč. 7, č. 2 (2012), s. 39-44. ISSN 1802-2308
Institutional support: RVO:68081731
Keywords : ESEM, * SEs Scintillation Detector * CFD * CAE * SolidWorks * Ansys
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0214577 - 3.0384060 - ÚPT 2013 RIV US eng J - Journal Article
Maxa, J. - Neděla, Vilém - Jirák, J.
Analysis Of Gas Flow In The New System Of Apertures In The Secondary Electron Scintillation Detector For ESEM.
Microscopy and Microanalysis. Roč. 18, Suppl. 2 (2012), s. 1264-1265. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : environmental scanning electron microscope * scintillation detector * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.495, year: 2012
Permanent Link: http://hdl.handle.net/11104/0213815 - 4.0368932 - ÚPT 2012 RIV US eng J - Journal Article
Jirák, J. - Čudek, P. - Neděla, Vilém
Detection of Secondary Electrons by Scintillation Detector at VP SEM.
Microscopy and Microanalysis. Roč. 17, Suppl. 2 (2011), s. 922-923. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : variable pressure scanning electron microscopes (VP-SEM) * scintillation detector * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 3.007, year: 2011
Permanent Link: http://hdl.handle.net/11104/0203133 - 5.0350812 - ÚPT 2011 RIV GB eng J - Journal Article
Jirák, J. - Neděla, Vilém - Černoch, P. - Čudek, P. - Runštuk, Jiří
Scintillation SE detector for variable pressure scanning electron microscopes.
Journal of Microscopy. Roč. 239, č. 3 (2010), s. 233-238. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : scintillation detector * secondary electrons detection * variable pressure scanning electron
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2010
Permanent Link: http://hdl.handle.net/11104/0190715 - 6.0205646 - UPT-D 20030028 RIV US eng J - Journal Article
Autrata, Rudolf - Jirák, J. - Schneider, L.
Usage of Segmental Ionization Detector in Environmental Conditions.
Microscopy and Microanalysis. Roč. 9, Sup. 3 (2003), s. 142 - 143. ISSN 1431-9276. E-ISSN 1435-8115.
[MC 2003. Dresden, 07.09.2003-12.09.2003]
R&D Projects: GA AV ČR IBS2065107; GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : segmental ionization detector * scanning electron microscope * gaseous environment
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.648, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101259 - 7.0205095 - UPT-D 980073 RIV US eng J - Journal Article
Autrata, Rudolf - Jirák, J. - Romanovský, Vladimír - Špinka, J.
Signal detection in environmental SEM with ionisation detector.
Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 115-116. ISSN 1040-7286.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100715 - 8.0205094 - UPT-D 980072 RIV US eng J - Journal Article
Autrata, Rudolf - Jirák, J. - Klvač, M. - Špinka, J.
Detection of backscattered electrons in environmental scanning electron microscope.
Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 113-114. ISSN 1040-7286.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100714 - 9.0204583 - UPT-D 940152 RIV DE eng J - Journal Article
Autrata, Rudolf - Jirák, J. - Špinka, J.
Backscattered electron detector for environmental scanning electron microscopes.
Beiträge zur elektronenmikroskopischen Direktabbildungen der Oberfläche. Roč. 26, - (1993), s. 13-18. ISSN 0340-3815
Permanent Link: http://hdl.handle.net/11104/0100206