0315789 - ÚJF 2009 DE eng A2 - Proceedings Abstract
Macková, Anna - Bočan, Jiří - Khaibullin, R. I. - Švorčík, V. - Slepička, P. - Siegel, J. - Valeev, V. F.RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI.
[RBS, UV-VIS a XPS charakterizace Ni+ 40 keV implantovaných polymerů PEEK, PET a PI.]
16th International Conference on Ion Beam Modification of Materials Book of Abstracts. Dresden: Institute of Ion Beam Physics and Materials Research, Forschungzentrum Dresden-Rossendorf, 2008. s. 317-317.
[16th International Conference on Ion Beam Modification of Materials. 31.08.2008-05.09.2008, Dresden]
R&D Projects: GA AV ČR(CZ) KJB100480601; GA MŠMT(CZ) LC06041
Institutional research plan: CEZ:AV0Z10480505
Keywords : ion implantation in polymers * TRIDYN * Ion Beam Analysis * UV-VIS, XPS
Subject RIV: JI - Composite Materials
Permanent Link: http://hdl.handle.net/11104/0165889