Search results

  1. 1.
    0525062 - ÚPT 2021 RIV NL eng J - Journal Article
    Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
    Acquisition of the dopant contrast in semiconductors with slow electrons.
    Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
    OECD category: Electrical and electronic engineering
    Impact factor: 1.957, year: 2020
    Method of publishing: Open access
    https://www.sciencedirect.com/science/article/pii/S036820481830135X
    Permanent Link: http://hdl.handle.net/11104/0309284

               
     
     
  2. 2.
    0205235 - UPT-D 20000011 RIV AT eng J - Journal Article
    Frank, Luděk - Steklý, Richard - Zadražil, Martin - El Gomati, M. M. - Müllerová, Ilona
    Electron Backscattering from Real and In-Situ Treated Surfaces.
    Microchimica Acta. Roč. 132, 2-4 (2000), s. 179-188. ISSN 0026-3672. E-ISSN 1436-5073
    R&D Projects: GA AV ČR IAA1065901; GA ČR GA202/99/0008
    Institutional research plan: CEZ:AV0Z2065902
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.303, year: 2000
    Permanent Link: http://hdl.handle.net/11104/0100853

               
     
     
  3. 3.
    0205230 - UPT-D 20000006 RIV NL eng J - Journal Article
    Frank, Luděk - Müllerová, Ilona - El Gomati, M. M.
    A novel in-lens detector for electrostatic scanning LEEM mini-column.
    Ultramicroscopy. Roč. 81, č. 2 (2000), s. 99-110. ISSN 0304-3991. E-ISSN 1879-2723
    Institutional research plan: CEZ:AV0Z2065902
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.695, year: 2000
    Permanent Link: http://hdl.handle.net/11104/0100848

               
     
     
  4. 4.
    0205090 - UPT-D 980068 RIV US eng J - Journal Article
    Zadražil, Martin - El Gomati, M. M. - Walker, A.
    Measurements of very low energy secondary and backscattered electron coefficients.
    Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 123-124. ISSN 1040-7286.
    [MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
    Grant - others: CEC(XE) CP93/12283
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100710

               
     
     
  5. 5.
    0204585 - UPT-D 940001 RIV CZ eng J - Journal Article
    Frank, Luděk - El Gomati, M. M.
    Auger Electron Microscopy: An Overview.
    Czechoslovak Journal of Physics. Roč. 44, č. 3 (1994), s. 173-193. ISSN 0011-4626.
    [Secondary Electrons in Electron Spectroscopy, Microscopy, and Microanalysis. Chlum, 21.09.1993-24.09.1993]
    Impact factor: 0.330, year: 1994
    Permanent Link: http://hdl.handle.net/11104/0002824

               
     
     
  6. 6.
    0100007 - UPT-D 20040007 RIV US eng J - Journal Article
    El Gomati, M. M. - Wells, T. C. R. - Müllerová, Ilona - Frank, Luděk - Jayakody, H.
    Why is it That Differently Doped Regions in Semiconductors are Visible in Low Voltage SEM?
    [Proč jsou různě dopované oblasti v polovodiči viditelné v nízko-napěťovém REM?]
    IEEE Transactions on Electron Devices. Roč. 51, č. 2 (2004), s. 288-292. ISSN 0018-9383. E-ISSN 1557-9646
    R&D Projects: GA AV ČR IAA1065304
    Keywords : doping of semiconductors * SEM imaging * inspection of patterns
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.036, year: 2004
    Permanent Link: http://hdl.handle.net/11104/0007514