Search results

  1. 1.
    0205406 - UPT-D 20010046 RIV IT eng C - Conference Paper (international conference)
    Müllerová, Ilona - Frank, Luděk - El Gomati, M. M.
    SLEEM Imaging of Doping Patterns in Semiconductors.
    Proceedings of 5th Multinational Congress on Electron Microscopy. Lecce: Rinton Press, 2001 - (Dini, L.; Catalano, M.), s. 317-318. ISBN 1-58949-003-7.
    [MCEM '01 /5./ - Multinational Congress on Electron Microscopy. Lecce (IT), 20.09.2001-25.09.2001]
    R&D Projects: GA AV ČR IAA1065901
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : UHV SEM * low energy range
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0101020

               
     
     
  2. 2.
    0205238 - UPT-D 20000014 RIV CZ eng C - Conference Paper (international conference)
    El Gomati, M. M. - Wells, T. C. R. - Frank, Luděk - Müllerová, Ilona
    On the imaging of semiconductor doping using low energy electron microscopy.
    Proceedings of the 12th European Congress on Electron Microscopy. Brno: Czechoslovak Society for Electron Microscopy, 2000 - (Frank, L.; Ciampor, F.), s. P635-P636. ISBN 80-238-5503-4.
    [EUREM /12./ - European Congress on Electron Microscopy. Brno (CZ), 09.07.2000-14.07.2000]
    Institutional research plan: CEZ:AV0Z2065902
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100856

               
     
     
  3. 3.
    0205150 - UPT-D 990053 RIV HU eng C - Conference Paper (international conference)
    Frank, Luděk - Steklý, Richard - Zadražil, Martin - El Gomati, M. M. - Müllerová, Ilona
    To the information depth of the backscattered electron signal.
    Proceedings of the 4th Multinational Congress on Electron Microscopy. Veszprém: University of Veszprém, 1999, s. 315-316.
    [MCEM '99 /4./ - Multinational Congress on Electron Microscopy. Veszprém (HU), 05.09.1999-08.09.1999]
    R&D Projects: GA AV ČR IPP1067701
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100770

               
     
     
  4. 4.
    0205126 - UPT-D 990029 RIV GB eng C - Conference Paper (international conference)
    El Gomati, M. M. - Müllerová, Ilona - Frank, Luděk
    Combination of Scanning Auger and Very-Low-Energy Electron Microscopy.
    Proceedings of the International Centennial Symposium on the Electron. Cambridge: The University Press, 1998 - (Kirkland, A.; Brown, P.), s. 326-333. ISBN 1-86125-051-7.
    [Electron - Centennial Symposium. Cambridge (GB), 15.09.1997-17.09.1997]
    R&D Projects: GA ČR GA202/95/0280
    Grant - others: CEC(XE) CP93/12283
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100746

               
     
     
  5. 5.
    0205085 - UPT-D 980021 RIV GB eng C - Conference Paper (international conference)
    El Gomati, M. M. - Assa'd, A. M. D. - El Gomati, T. - Zadražil, Martin
    On the measurement of low energy backscattered and secondary electron coefficients.
    Electron Microscopy and Analysis 1997 - Proceedings of the Institute of Physics Conference (Series Number 153, Section 7). Bristol: Institute of Physics Publishing Ltd., 1997 - (Rodenburg, J.), s. 265-268. ISBN 0-7503-0441-3.
    [EMAG '97 - Electron Microscopy and Analysis Conference. Cambridge (GB), 02.09.1997-05.09.1997]
    Grant - others: CEC(XE) CP93/12283
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100705

               
     
     
  6. 6.
    0205083 - UPT-D 980019 RIV GB eng C - Conference Paper (international conference)
    Srnanek, R. - Satka, A. - Liday, J. - Vogrincic, P. - Kovac, J. - Zadražil, Martin - Frank, Luděk - El Gomati, M. M.
    Study of bevelled InP-based heterostructures by low energy SEM and AES.
    Electron Microscopy and Analysis 1997 - Proceedings of the Institute of Physics Conference (Series Number 153, Section 10). Bristol: Institute of Physics Publishing Ltd., 1997 - (Rodenburg, J.), s. 453-456. ISBN 0-7503-0441-3.
    [EMAG '97 - Electron Microscopy and Analysis Conference. Cambridge (GB), 02.09.1997-05.09.1997]
    Grant - others: CEC(XE) CP93/12283
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100703

               
     
     
  7. 7.
    0204995 - UPT-D 980026 RIV MX eng C - Conference Paper (international conference)
    Zadražil, Martin - El Gomati, M. M.
    Measurements of the secondary and backscattered electron coefficients in the energy range 250-5000eV.
    Proceedings of the 14th International Congress on Electron Microscopy. Bristol: Institute of Physics Publishing Ltd., 1998 - (Benavides, H.; Yacamán, M.), s. 495-496. ISBN 0-7503-0568-1.
    [ICEM /14./ - International Congress on Electron Microscopy. Cancun (MX), 31.08.1998-04.09.1998]
    Grant - others: CEC(XE) CP93/12283
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100615

               
     
     
  8. 8.
    0204992 - UPT-D 980023 RIV MX eng C - Conference Paper (international conference)
    Müllerová, Ilona - Frank, Luděk - El Gomati, M. M.
    A compact combined Auger and very low energy electron scanning microscopy.
    Proceedings of the 14th International Congress on Electron Microscopy. Bristol: Institute of Physics Publishing Ltd., 1998 - (Benavides, H.; Yacamán, M.), s. 375-376. ISBN 0-7503-0568-1.
    [ICEM /14./ - International Congress on Electron Microscopy. Cancun (MX), 31.08.1998-04.09.1998]
    R&D Projects: GA ČR GA202/96/0961
    Grant - others: CEC(XE) CP93/12283
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100612

               
     
     
  9. 9.
    0204988 - UPT-D 980016 RIV CZ eng C - Conference Paper (international conference)
    Zadražil, Martin - El Gomati, M. M.
    Measurements of the Secondary and Backscattered Electron Coefficients in the Very Low Energy Range.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 6th Seminar. Brno: Czechoslovak Society for Electron Microscopy, 1998 - (Müllerová, I.; Frank, L.), s. 82. ISBN 80-238-2333-7.
    [Recent Trends /6./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 29.06.1998-03.07.1998]
    Grant - others: CEC(XE) CP93/12283
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100608

               
     
     
  10. 10.
    0204907 - UPT-D 970042 RIV SK eng C - Conference Paper (international conference)
    Frank, Luděk - Müllerová, Ilona - El Gomati, M. M.
    Localised information in scanning electron beam excited imaging of surfaces.
    Proccedings of the International Seminar New Trends in Surface Analysis NTSA '97. Bratislava: Slovak University of Technology, Faculty of Electrical Engineering and Information Technology, 1997 - (Breza, J.; Liday, J.; Frank, L.; Král, J.), s. 1-4. ISBN 80-227-1010-5.
    [NTSA '97 - New Trends in Surface Analysis. Bratislava (SK), 26.11.1997-27.11.1997]
    R&D Projects: GA ČR GA202/95/0280; GA ČR GA202/96/0961
    Grant - others: CEC(XE) CP93:12283
    Permanent Link: http://hdl.handle.net/11104/0100527