Search results

  1. 1.
    0205124 - UPT-D 990027 GB eng A - Abstract
    Steklý, Richard - Zadražil, Martin - El Gomati, M. M. - Frank, Luděk - Müllerová, Ilona
    Surface Cleanliness and Electron Backscattering.
    Book of Abstracts EMAS '99 - 6th European Workshop on Modern Developments and Applications in Microbeam Analysis. Konstanz: European Microbeam Analysis Society, 1999. s. 344.
    [EMAS '99 /6./ - European Workshop on Modern Developments and Applications in Microbeam Analysis. 03.05.1999-07.05.1999, Konstanz]
    R&D Projects: GA AV ČR IPP1067701
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100744

               
     
     
  2. 2.
    0204990 - UPT-D 980018 NL eng A - Abstract
    Frank, Luděk - Müllerová, Ilona - El Gomati, M. M.
    Mini-Column for Low-Energy Electron Imaging in CMA.
    Abstracts of the 5th International Conference on Charged Particle Optics. Delft: Delft University of Technology, 1998. s. 90.
    [Charged Particle Optics /5./. 14.04.1998-17.04.1998, Delft]
    Grant - others: CEC(XE) CP93/12283
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100610

               
     
     
  3. 3.
    0204933 - UPT-D 970068 GB eng A - Abstract
    El Gomati, M. M. - Müllerová, Ilona - Frank, Luděk
    Image contrast by Auger and very low energy electron microscopy.
    Programme of the International Centennial Symposium on the Electron. Cambridge: University of Cambridge, 1997. s. P16.
    [Electron - Centennial Symposium. 15.09.1997-17.10.1997, Cambridge]
    Permanent Link: http://hdl.handle.net/11104/0100553

               
     
     
  4. 4.
    0204910 - UPT-D 970045 GB eng A - Abstract
    Srnánek, R. - Satka, A. - Liday, J. - Vogrincic, P. - Kováč, J. - Zadražil, Martin - Frank, Luděk - El Gomati, M. M.
    Study of bevelled InP-based heterostructures by low energy SEM and AES.
    Abstract Book - Electron Microscopy and Analysis Conference. Cambridge: Institute of Physics, 1997. s. PSE.6.
    [EMAG - Electron Microscopy and Analysis Conference. 02.09.1997-05.09.1997, Cambridge]
    Permanent Link: http://hdl.handle.net/11104/0100530