Search results
- 1.0205124 - UPT-D 990027 GB eng A - Abstract
Steklý, Richard - Zadražil, Martin - El Gomati, M. M. - Frank, Luděk - Müllerová, Ilona
Surface Cleanliness and Electron Backscattering.
Book of Abstracts EMAS '99 - 6th European Workshop on Modern Developments and Applications in Microbeam Analysis. Konstanz: European Microbeam Analysis Society, 1999. s. 344.
[EMAS '99 /6./ - European Workshop on Modern Developments and Applications in Microbeam Analysis. 03.05.1999-07.05.1999, Konstanz]
R&D Projects: GA AV ČR IPP1067701
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100744 - 2.0204990 - UPT-D 980018 NL eng A - Abstract
Frank, Luděk - Müllerová, Ilona - El Gomati, M. M.
Mini-Column for Low-Energy Electron Imaging in CMA.
Abstracts of the 5th International Conference on Charged Particle Optics. Delft: Delft University of Technology, 1998. s. 90.
[Charged Particle Optics /5./. 14.04.1998-17.04.1998, Delft]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100610 - 3.0204933 - UPT-D 970068 GB eng A - Abstract
El Gomati, M. M. - Müllerová, Ilona - Frank, Luděk
Image contrast by Auger and very low energy electron microscopy.
Programme of the International Centennial Symposium on the Electron. Cambridge: University of Cambridge, 1997. s. P16.
[Electron - Centennial Symposium. 15.09.1997-17.10.1997, Cambridge]
Permanent Link: http://hdl.handle.net/11104/0100553 - 4.0204910 - UPT-D 970045 GB eng A - Abstract
Srnánek, R. - Satka, A. - Liday, J. - Vogrincic, P. - Kováč, J. - Zadražil, Martin - Frank, Luděk - El Gomati, M. M.
Study of bevelled InP-based heterostructures by low energy SEM and AES.
Abstract Book - Electron Microscopy and Analysis Conference. Cambridge: Institute of Physics, 1997. s. PSE.6.
[EMAG - Electron Microscopy and Analysis Conference. 02.09.1997-05.09.1997, Cambridge]
Permanent Link: http://hdl.handle.net/11104/0100530