Search results
- 1.0205568 - UPT-D 20020118 RIV NL eng J - Journal Article
Müllerová, Ilona - El-Gomati, M. - Frank, Luděk
Imaging of the boron doping in silicon using low energy SEM.
Ultramicroscopy. Roč. 93, 3/4 (2002), s. 223 - 243. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA1065901; GA AV ČR IBS2065017
Institutional research plan: CEZ:AV0Z2065902
Keywords : electron and ion microscopes * semiconductor doping
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.772, year: 2002
Permanent Link: http://hdl.handle.net/11104/0101181 - 2.0205378 - UPT-D 20010017 RIV US eng J - Journal Article
Müllerová, Ilona
Imaging of Specimens at Optimized Low and Very Low Energies in Scanning Electron Microscopes.
Scanning. Roč. 23, č. 6 (2001), s. 379-394. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA AV ČR IAA1065901
Institutional research plan: CEZ:AV0Z2065902
Keywords : contrast mechanisms * low electron energies * scanning electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.389, year: 2001
Permanent Link: http://hdl.handle.net/11104/0100992 - 3.0205325 - UPT-D 20000104 RIV DE eng J - Journal Article
Müllerová, Ilona - Frank, Luděk
Multidimensionality of the Scanned Imaging with Very low Energy Electrons.
G.I.T. Imaging and Microscopy. Roč. 2, č. 2 (2000), s. 20-23. ISSN 1439-4243
R&D Projects: GA AV ČR IAA1065901
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100939 - 4.0205235 - UPT-D 20000011 RIV AT eng J - Journal Article
Frank, Luděk - Steklý, Richard - Zadražil, Martin - El Gomati, M. M. - Müllerová, Ilona
Electron Backscattering from Real and In-Situ Treated Surfaces.
Microchimica Acta. Roč. 132, 2-4 (2000), s. 179-188. ISSN 0026-3672. E-ISSN 1436-5073
R&D Projects: GA AV ČR IAA1065901; GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.303, year: 2000
Permanent Link: http://hdl.handle.net/11104/0100853