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- 1.0204543 - UPT-D 930035 RIV US eng J - Journal Article
Müllerová, Ilona - Frank, Luděk
Very low energy microscopy in commercial SEMs.
Scanning. Roč. 15, č. 4 (1993), s. 193-201. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA AV ČR IA16507
Impact factor: 1.000, year: 1993
Permanent Link: http://hdl.handle.net/11104/0100167