Search results
- 1.0205377 - UPT-D 20010016 RIV US eng J - Journal Article
Frank, Luděk - Zadražil, Martin - Müllerová, Ilona
Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System.
Scanning. Roč. 23, č. 1 (2001), s. 36-50. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA ČR GA202/96/0961; GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscopy * specimen charging * nonconductive specimens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.389, year: 2001
Permanent Link: http://hdl.handle.net/11104/0100991 - 2.0205235 - UPT-D 20000011 RIV AT eng J - Journal Article
Frank, Luděk - Steklý, Richard - Zadražil, Martin - El Gomati, M. M. - Müllerová, Ilona
Electron Backscattering from Real and In-Situ Treated Surfaces.
Microchimica Acta. Roč. 132, 2-4 (2000), s. 179-188. ISSN 0026-3672. E-ISSN 1436-5073
R&D Projects: GA AV ČR IAA1065901; GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.303, year: 2000
Permanent Link: http://hdl.handle.net/11104/0100853