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0205400 - UPT-D 20010040 RIV GB eng J - Journal Article
Franta, D. - Ohlídal, I. - Klapetek, P. - Pokorný, Pavel - Ohlídal, M.
Analysis of Inhomogeneous Thin Films of ZrO₂ by the Combined Optical Method and Atomic Force Microscopy.
Surface and Interface Analysis. Roč. 23, č. 1 (2001), s. 91-94. ISSN 0142-2421. E-ISSN 1096-9918
R&D Projects: GA ČR GA202/98/0988; GA ČR GA101/98/0772; GA ČR GV106/96/K245; GA MŠMT VS96084
Institutional research plan: CEZ:AV0Z2065902
Keywords : inhomogeneous ZrO 2 films * optical characterization * AFM
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 0.987, year: 2001
Permanent Link: http://hdl.handle.net/11104/0101014