Search results
- 1.0205544 - UPT-D 20020094 RIV US eng J - Journal Article
Müllerová, Ilona
Imaging of specimens at optimized low and very low energies in scanning electron microscopy.
Scanning Microscopy. Roč. 13, č. 1 (1999), s. 7 - 22. ISSN 0891-7035
R&D Projects: GA AV ČR IAA2065502; GA ČR GA202/95/0280; GA ČR GA202/96/0961
Institutional research plan: CEZ:AV0Z2065902
Keywords : contrast mechanisms * scanning electron microscope * low electron energies
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.000, year: 1999
Permanent Link: http://hdl.handle.net/11104/0101157 - 2.0205377 - UPT-D 20010016 RIV US eng J - Journal Article
Frank, Luděk - Zadražil, Martin - Müllerová, Ilona
Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System.
Scanning. Roč. 23, č. 1 (2001), s. 36-50. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA ČR GA202/96/0961; GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscopy * specimen charging * nonconductive specimens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.389, year: 2001
Permanent Link: http://hdl.handle.net/11104/0100991 - 3.0204999 - UPT-D 980034 RIV CZ cze J - Journal Article
Zadražil, Martin - Frank, Luděk - Müllerová, Ilona
Rastrovací elektronová mikroskopie nevodivých vzorků.
[Scanning Electron Microscopy of Non-Conducting Specimens.]
Bulletin československé společnosti elektronové mikroskopie CSEM. č. 9 (1998), s. 33. ISSN 1212-1258
R&D Projects: GA ČR GA202/96/0961
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100619