Search results
- 1.0205544 - UPT-D 20020094 RIV US eng J - Journal Article
Müllerová, Ilona
Imaging of specimens at optimized low and very low energies in scanning electron microscopy.
Scanning Microscopy. Roč. 13, č. 1 (1999), s. 7 - 22. ISSN 0891-7035
R&D Projects: GA AV ČR IAA2065502; GA ČR GA202/95/0280; GA ČR GA202/96/0961
Institutional research plan: CEZ:AV0Z2065902
Keywords : contrast mechanisms * scanning electron microscope * low electron energies
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.000, year: 1999
Permanent Link: http://hdl.handle.net/11104/0101157 - 2.0205101 - UPT-D 990003 RIV US eng J - Journal Article
Frank, Luděk - Müllerová, Ilona - Faulian, K. - Bauer, E.
The Scanning Low-Energy Electron Microscope: First Attainment of Diffraction Contrast in the Scanning Electron Microscope.
Scanning. Roč. 21, č. 1 (1999), s. 1-13. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA AV ČR IAA2065502; GA ČR GA202/95/0280; GA AV ČR KSK1067601; GA AV ČR IPP1067701
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.187, year: 1999
Permanent Link: http://hdl.handle.net/11104/0100721 - 3.0205098 - UPT-D 980076 RIV US eng J - Journal Article
Müllerová, Ilona
Microscopy with slow electrons.
Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 97-100. ISSN 1040-7286.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
R&D Projects: GA ČR GA202/95/0280
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100718 - 4.0205092 - UPT-D 980070 RIV US eng J - Journal Article
Frank, Luděk - Müllerová, Ilona
Wave-optical contrast in SEM.
Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 109-110. ISSN 1040-7286.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
R&D Projects: GA ČR GA202/95/0280
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100712 - 5.0205091 - UPT-D 980069 RIV US eng J - Journal Article
Müllerová, Ilona - Zadražil, Martin - Frank, Luděk
Low-energy SEM imaging of bevelled multilayers.
Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 121-122. ISSN 1040-7286.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
R&D Projects: GA ČR GA202/95/0280
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100711 - 6.0204962 - UPT-D 970098 RIV CZ eng J - Journal Article
Müllerová, Ilona - Frank, Luděk
Low Energy Scanning Electron Microscopy (LESEM).
Jemná mechanika a optika. Roč. 42, 11-12 (1997), s. 335-340. ISSN 0447-6441
R&D Projects: GA ČR GA202/95/0280
Permanent Link: http://hdl.handle.net/11104/0100582