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- 1.0130407 - FZU-D 950369 RIV SK eng C - Conference Paper (international conference)
Jurek, Karel - Šimečková, Marta - Chval, Jindřich
Quantitative X-ray microanalysis of thin films - test of t he program STRATA.
Proceedings of the 7th Czecho-Slovak Conference on Thin Fi lms. Bratislava, 1993 - (Tvarožek, V.; - Németh, Š.), s. 123-126
[Czecho-Slovak Conference on Thin Films (7.). Liptovský Mikuláš (SK), 14.06.1993-18.06.1993]
R&D Projects: GA ČR GA104/93/2150
Permanent Link: http://hdl.handle.net/11104/0028534