Search results
- 1.0205251 - UPT-D 20000027 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Špinka, Jiří
Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures.
Proceedings of the 12th European Congress on Electron Microscopy. Brno: Czechoslovak Society for Electron Microscopy, 2000 - (Frank, L.; Čiampor, F.), s. I245-I246. ISBN 80-238-5503-4.
[EUREM /12./ - European Congress on Electron Microscopy. Brno (CZ), 09.07.2000-14.07.2000]
R&D Projects: GA ČR GA102/00/0969
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100869 - 2.0205249 - UPT-D 20000025 RIV CZ eng C - Conference Paper (international conference)
Romanovský, Vladimír - Autrata, Rudolf
Combined scintillation and ionisation detectors for environmental scanning electron microscopes.
Proceedings of the 12th European Congress on Electron Microscopy. Brno: Czechoslovak Society for Electron Microscopy, 2000 - (Frank, L.; Čiampor, F.), s. I241-I242. ISBN 80-238-5503-4.
[EUREM /12./ - European Congress on Electron Microscopy. Brno (CZ), 09.07.2000-14.07.2000]
R&D Projects: GA ČR GA102/00/0969
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100867 - 3.0205244 - UPT-D 20000020 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef
Scanning electron microscopy at low vacuum in specimen chamber.
Proceedings of the 12th European Congress on Electron Microscopy. Brno: Czechoslovak Society for Electron Microscopy, 2000 - (Frank, L.; Čiampor, F.), s. I211-I212. ISBN 80-238-5503-4.
[EUREM /12./ - European Congress on Electron Microscopy. Brno (CZ), 09.07.2000-14.07.2000]
R&D Projects: GA ČR GA102/00/0969
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100862