Search results
- 1.0308385 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk
Grain Contrast in Very Low Energy SEM.
[Kontrast zrn na velmi nízkých energiích v REM.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 63-64. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : grain contrast * very low energy * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0160884 - 2.0109081 - UPT-D 20040085 RIV BE eng C - Conference Paper (international conference)
Matsuda, K. - Matsuki, T. - Frank, Luděk - Müllerová, Ilona - Itoh, S. - Akatsu, M. - Uetani, Y. - Ikeno, S.
Morphology of MgAl2O4 at interface between Al2O3 and matrix in oxide particles / Al alloy composite materials.
[Morfologie MgAl2O4 na rozhraní mezi Al2O3 a matricí v kompozitních materiálech typu oxidové částice / Al slitina.]
EMC 2004 - Proceedings of the 13th European Microscopy Congress. Vol. 2. Liege: Belgian Society for Microscopy, 2004, s. 627-628.
[EMC 2004 /13./ European Microscopy Congress. Antwerp (BE), 22.08.2004-27.08.2004]
R&D Projects: GA ČR GA202/04/0281
Keywords : AJ-Mg-Si alloy * metal matrix composite * SLEEM
Subject RIV: JI - Composite Materials
Permanent Link: http://hdl.handle.net/11104/0016193 - 3.0109068 - UPT-D 20040071 RIV JP eng C - Conference Paper (international conference)
Matsuda, K. - Kajikawa, M. - Nakamura, Y. - Frank, Luděk - Müllerová, Ilona - Itoh, S. - Akatsu, M. - Uetani, Y. - Ikeno, S.
Application of SLEEM for Morphology of Alpha-Phase in Cu-Zn-Si Alloy.
[Studium morfologie alfa-fáze ve slitině Cu-Zn-Si pomocí SLEEM.]
Proceedings of the 8th Asia-Pacific Conference on Electron Microscopy. Kanazawa: 8APEM Publication Committee, 2004, s. 823-824. ISBN 4-9902106-0-3.
[APEM /8./ Asia-Pacific Conference on Electron Microscopy. Kanazawa (JP), 07.06.2004-11.06.2004]
R&D Projects: GA ČR GA202/04/0281
Keywords : Cu-Zn alloy * .alpha.-phase * SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016180 - 4.0109067 - UPT-D 20040070 RIV JP eng C - Conference Paper (international conference)
Frank, Luděk
Advances in SEM Methodology and Instrumentation.
[Pokroky v metodologii a instrumentaci pro rastrovací elektronovou mikroskopii.]
Proceedings of the 8th Asia-Pacific Conference on Electron Microscopy. Kanazawa: 8APEM Publication Committee, 2004, s. 40-41. ISBN 4-9902106-0-3.
[APEM /8./ Asia-Pacific Conference on Electron Microscopy. Kanazawa (JP), 07.06.2004-11.06.2004]
R&D Projects: GA ČR GA202/04/0281
Keywords : SEM * methodology * instrumentation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016179 - 5.0109066 - UPT-D 20040069 RIV JP eng C - Conference Paper (international conference)
Matsuda, K. - Matsuki, T. - Frank, Luděk - Müllerová, Ilona - Itoh, S. - Akatsu, M. - Uetani, Y. - Ikeno, S.
Scanning Low Energy Electron Microscope Applications for Microstructure of Al2O3/Al-Mg-Si Alloy Matrix Composite Material.
[Použití rastrovacího nízkoenergiového elektronového mikroskopu ke studiu mikrostruktury kompozitního materiálu se slitinovou matricí Al2O3/Al-Mg-Si.]
Proceedings of the 8th Asia-Pacific Conference on Electron Microscopy. Kanazawa: 8APEM Publication Committee, 2004, s. 779-780. ISBN 4-9902106-0-3.
[APEM /8./ Asia-Pacific Conference on Electron Microscopy. Kanazawa (JP), 07.06.2004-11.06.2004]
R&D Projects: GA ČR GA202/04/0281
Keywords : Al2O3 * metal matrix composite * SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016178 - 6.0109049 - UPT-D 20040050 RIV CZ eng C - Conference Paper (international conference)
Romanovský, V. - El Gomati, M. M. - Frank, Luděk - Müllerová, Ilona
Electrostatic Low Energy Scanning Electron Microscope for Auger Analysis.
[Elektrostatický nízkoenergiový rastrovací elektronový mikroskop pro Augerovu analýzu.]
Proceedings of the 9th International Seminar Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, 2004 - (Müllerová, I.), s. 65-66. ISBN 80-239-3246-2.
[Recent Trends /9./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 12.07.2004-16.07.2004]
R&D Projects: GA ČR GA202/04/0281
Keywords : scanning low energy electron microscope * scanning Auger microscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016161 - 7.0109034 - UPT-D 20040035 RIV BE eng C - Conference Paper (international conference)
Frank, Luděk - Müllerová, Ilona - Novák, L. - Horáček, Miroslav - Konvalina, Ivo
A method for objective quantification of the efficiency of electron detectors.
[Metoda kvantifikace účinnosti elektronových detektorů.]
EMC 2004 - Proceedings of the 13th European Microscopy Congress. Vol. 1. Liege: Belgian Society for Microscopy, 2004, s. 67-68.
[EMC 2004 /13./ European Microscopy Congress. Antwerp (BE), 22.08.2004-27.08.2004]
R&D Projects: GA ČR GA202/04/0281
Keywords : detection quantum efficiency * electron detectors * collection efficiency
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016146 - 8.0109029 - UPT-D 20040030 RIV BE eng C - Conference Paper (international conference)
Frank, Luděk
Low energy and high pressure trends in SEM instrumentation - the state of the art.
[Tendence k nízkým energiím a vysokým tlakům v přístrojové technice pro REM - současný stav.]
EMC 2004 - Proceedings of the 13th European Microscopy Congress. Vol. 1. Liege: Belgian Society for Microscopy, 2004, s. 321-322.
[EMC 2004 /13./ European Microscopy Congress. Antwerp (BE), 22.08.2004-27.08.2004]
R&D Projects: GA ČR GA202/04/0281
Keywords : low energy SEM * variable pressure SEM * environmental SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016141 - 9.0050919 - ÚPT 2007 RIV JP eng C - Conference Paper (international conference)
Hovorka, Miloš - Frank, Luděk - Valdaitsev, D. - Nepijko, S. - Elmers, H. - Schönhense, G.
High-pass Energy filtered PEEM Imaging of Dopants in Silicon.
[Studium vlastností dopovaného křemíku pomocí fotoemisní elektronové mikroskopie s využitím energiového filtru.]
The 5th International Conference on LEEM/PEEM. Himeji: JSRRI, 2006, s. 176.
[LEEM/PEEM /5./. Himeji (JP), 15.10.2006-19.10.2006]
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : silicon * photoemission electron microscopy * contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0140946 - 10.0049020 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk
Methods of Direct Imaging of the Local Density of States with Electrons.
[Metody přímého zobrazování hustoty stavů pomocí elektronů.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 59-60. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : local density of states * image contrast * electron reflectivity * very low energy electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139517