Search results
- 1.0205643 - UPT-D 20030025 RIV US eng J - Journal Article
Frank, Luděk - Matsuda, K. - Hrnčiřík, Petr - Müllerová, Ilona
Low Energy Contrast of Metal Matrix Composite in SEM.
Microscopy and Microanalysis. Roč. 9, Sup. 3 (2003), s. 328 - 329. ISSN 1431-9276. E-ISSN 1435-8115.
[MC 2003. Dresden, 07.09.2003-12.09.2003]
R&D Projects: GA AV ČR IAA1065304
Institutional research plan: CEZ:AV0Z2065902
Keywords : low energy contrasts * scanning electron microscope * aluminium alloys
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.648, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101256 - 2.0205642 - UPT-D 20030024 RIV US eng J - Journal Article
Müllerová, Ilona - Frank, Luděk
Contrast Mechanisms in the Scanning Low Energy Electron Microscopy.
Microscopy and Microanalysis. Roč. 9, Sup. 3 (2003), s. 120 - 121. ISSN 1431-9276. E-ISSN 1435-8115.
[MC 2003. Dresden, 07.09.2003-12.09.2003]
R&D Projects: GA AV ČR IPP1050128; GA AV ČR IAA1065304
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscope * primary electrons * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.648, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101255 - 3.0205639 - UPT-D 20030021 RIV US eng J - Journal Article
Čižmár, Petr - Müllerová, Ilona
New Multichannel Electron Energy Analyzer with Cylindrically Symmetrical Electrostatic Field.
Microscopy and Microanalysis. Roč. 9, Sup. 3 (2003), s. 18 - 19. ISSN 1431-9276. E-ISSN 1435-8115.
[MC 2003. Dresden, 07.09.2003-12.09.2003]
R&D Projects: GA AV ČR IAA1065304
Institutional research plan: CEZ:AV0Z2065902
Keywords : Auger spectroscopy * surface examination * scanning electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.648, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101252 - 4.0100008 - UPT-D 20040008 RIV US eng J - Journal Article
Müllerová, Ilona - Frank, Luděk
Contrast at Very Low Energies of the Gold/Carbon Specimen for Resolution Testing.
[Kontrast při velmi nízkých energiích u vzorku zlato/uhlík pro testování rozlišení.]
Scanning. Roč. 25, 18/24 (2004), s. 18-24. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA AV ČR IAA1065304
Keywords : scanning electron microscope * very low energy * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.892, year: 2004
Permanent Link: http://hdl.handle.net/11104/0007515 - 5.0100007 - UPT-D 20040007 RIV US eng J - Journal Article
El Gomati, M. M. - Wells, T. C. R. - Müllerová, Ilona - Frank, Luděk - Jayakody, H.
Why is it That Differently Doped Regions in Semiconductors are Visible in Low Voltage SEM?
[Proč jsou různě dopované oblasti v polovodiči viditelné v nízko-napěťovém REM?]
IEEE Transactions on Electron Devices. Roč. 51, č. 2 (2004), s. 288-292. ISSN 0018-9383. E-ISSN 1557-9646
R&D Projects: GA AV ČR IAA1065304
Keywords : doping of semiconductors * SEM imaging * inspection of patterns
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.036, year: 2004
Permanent Link: http://hdl.handle.net/11104/0007514 - 6.0082849 - ÚPT 2007 RIV US eng J - Journal Article
Čižmár, Petr - Müllerová, Ilona - Jacka, M. - Pratt, A.
New multichannel electron energy analyzer with cylindrically symmetrical electrostatic field.
[Nový mnohakanálový analyzátor energií elektronů s válcově symetrickým elektrostatickým polem.]
Review of Scientific Instruments. Roč. 78, č. 5 (2007), 053714:1-5. ISSN 0034-6748. E-ISSN 1089-7623
R&D Projects: GA AV ČR IAA1065304
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron energy analyzer * multichannel analyzer * Auger analysis
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.384, year: 2007
Permanent Link: http://hdl.handle.net/11104/0146291 - 7.0028799 - ÚPT 2006 RIV JP eng J - Journal Article
Frank, Luděk
Noise in secondary electron emission: the low yield case.
[Šum sekundární emise elektronů při nízkém emisním výtěžku.]
Journal of Electron Microscopy. Roč. 54, č. 4 (2005), s. 361-365. ISSN 0022-0744
R&D Projects: GA AV ČR(CZ) IAA1065304
Keywords : secondary electrons * noise * SEM image noise * secondary emission noise * statistics of secondary electrons * non-Poisson factor
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.720, year: 2005
Permanent Link: http://hdl.handle.net/11104/0118707 - 8.0022382 - ÚPT 2006 RIV JP eng J - Journal Article
Matsuda, K. - Ikeno, S. - Müllerová, Ilona - Frank, Luděk
The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites.
[Využití rastrovací elektronové mikroskopie s pomalými elektrony při studiu slitin a kompozitů na bázi hliníku.]
Journal of Electron Microscopy. Roč. 54, č. 2 (2005), s. 109-117. ISSN 0022-0744
R&D Projects: GA AV ČR(CZ) IAA1065304
Keywords : scanning low energy electron microscopy * precipitates in Al-Mg-Si alloys * Al-alloy-base/ceramic composite
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.720, year: 2005
Permanent Link: http://hdl.handle.net/11104/0111123