Search results
- 1.0205652 - UPT-D 20030034 RIV HR eng C - Conference Paper (international conference)
Müllerová, Ilona - Frank, Luděk
Current trends in scanning low energy electron microscopy (SLEEM).
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 85 - 86
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA AV ČR IAA1065304
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscopy * primary beam energy * field emission gun
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101265 - 2.0109103 - UPT-D 20040108 RIV DE eng C - Conference Paper (international conference)
Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
Influence of magnetic and electrostatic fields in the specimen vicinity on trajectories of secondary electrons in SEM.
[Vliv magnetického a elektrostatického pole v oblasti vzorku na trajektorie sekundárních elektronů v REM.]
Autumn School on Materials Science and Electron Microscopy 2004 - Emerging Microscopy for Advanced Materials Development: Imaging and Spectroscopy on Atomic Scale. Berlin: Humboldt University of Berlin, 2004, 24/1-24/2.
[Autumn School on Materials Science and Electron Microscopy 2004. Berlin (DE), 03.10.2004-07.10.2004]
R&D Projects: GA AV ČR IAA1065304
Keywords : SEM * detective quantum efficiency * electron trajectories
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016215 - 3.0109039 - UPT-D 20040040 RIV CZ eng C - Conference Paper (international conference)
Čižmár, Petr
The Optical Part of the Multichannel Electron Energy Analyzer.
[Optická část mnohakanálového energiového analyzátoru elektronů.]
Proceedings of the 9th International Seminar Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, 2004 - (Müllerová, I.), s. 21-22. ISBN 80-239-3246-2.
[Recent Trends /9./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 12.07.2004-16.07.2004]
R&D Projects: GA AV ČR IAA1065304
Keywords : energy analyzer * scintillator * CCD detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016151 - 4.0109031 - UPT-D 20040032 RIV BE eng C - Conference Paper (international conference)
Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM.
[Sběrová účinnost Everhart-Thornley-ho detektoru sekundárních elektronů v REM.]
EMC 2004 - Proceedings of the 13th European Microscopy Congress. Vol. 1. Liege: Belgian Society for Microscopy, 2004, s. 79-80.
[EMC 2004 /13./ European Microscopy Congress. Antwerp (BE), 22.08.2004-27.08.2004]
R&D Projects: GA AV ČR IAA1065304
Keywords : scanning electron microscopy * collection efficiency * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016143 - 5.0100019 - UPT-D 20040019 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Frank, Luděk
Examination of electronic structures and materials in scanning low energy electron microscope (SLEEM).
[Zkoumání elektronických struktur a materiálů v rastrovacím nízko-energiovém elektronovém mikroskopu (SLEEM).]
Proceedings of the International Conference NANO'03. Praha: ČSNMT, 2003, s. 87-92. ISBN 80-214-2527-X.
[NANO'03 International Conference. Brno (CZ), 21.09.2003-23.09.2003]
R&D Projects: GA AV ČR IAA1065304
Keywords : SLEEM * electronic structures of the specimen * image resolutions
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0007526 - 6.0022547 - ÚPT 2006 RIV SI eng C - Conference Paper (international conference)
Müllerová, Ilona
Remarks to angular and energy sensitivity of image contrast formation in low energy SEM.
[Poznámky k úhlové a energiové citlivosti tvorby obrazového kontrastu v nízkoenergiovém REM.]
Proceedings - 7th Multinational Congress on Microscopy (MCM 2005). Ljubljana: Jožef Stefan Institute, 2005, s. 95-98. ISBN 961-6303-69-4.
[Multinational Congress on Microscopy /7./. Portorož (SI), 26.06.2005-30.06.2005]
R&D Projects: GA AV ČR(CZ) IAA1065304
Keywords : low energy electrons * collection efficiency * scanning electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0111275 - 7.0022403 - ÚPT 2006 RIV CH eng C - Conference Paper (international conference)
Konvalina, Ivo - Müllerová, Ilona
Factors affecting the Collection Efficiency of Secondary Electrons in SEM.
[Faktory ovlivňující sběrovou účinnost sekundárních elektronů v REM.]
Proceedings - Microscopy Conference 2005 - Dreiländertagung /6./. Villigen: Paul Scherrer Institute, 2005, s. 48. ISBN N. ISSN 1019-6447.
[Dreiländertagung Microscopy Conference (MC 2005). Davos (CH), 28.08.2005-02.09.2005]
R&D Projects: GA AV ČR(CZ) IAA1065304
Keywords : ET detector * secondary electrons * collection efficiency
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0111143 - 8.0022398 - ÚPT 2006 RIV CH eng C - Conference Paper (international conference)
Čižmár, Petr - Müllerová, Ilona
New Multichannel Electron Energy Analyzer for Auger and Secondary Electron Analysis.
[Nový mnohakanálový analyzátor energií Augerových a sekundárních elektronů.]
Proceedings - Microscopy Conference 2005 - Dreiländertagung /6./. Villigen: Paul Scherrer Institute, 2005, s. 2. ISBN N. ISSN 1019-6447.
[Dreiländertagung Microscopy Conference (MC 2005). Davos (CH), 28.08.2005-02.09.2005]
R&D Projects: GA AV ČR IAA1065304
Keywords : secondary electrons * Auger electrons * cylindrically symmetrical field
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0111138