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- 1.0205683 - UPT-D 20030065 CZ eng A - Abstract
Müllerová, Ilona - Frank, Luděk
Examination of electronic structures and materials in scanning low energy electron microscope (SLEEM).
Abstract Booklet of the International Conference NANO'03. Brno: FS VUT Brno, 2003 - (Šandera, P.). s. 26. ISBN 80-214-2486-9.
[NANO'03. 21.09.2003-23.09.2003, Brno]
R&D Projects: GA AV ČR IAA1065304
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscope * primary beam energies * objective lenses
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101296