Search results
- 1.0188219 - UMCH-V 20000369 RIV CZ eng C - Conference Paper (international conference)
Nešpůrek, Stanislav - Sworakowski, J.
The influence of dipolar species on on-chain mobility in polysilanes.
COST 518. Brno: Brno University of Technology, Faculty of Chemistry, 2000, s. -.
[Molecular Materials and Functional Polymers for Advanced Device Meeting. Brno (CZ), 17.11.2000-19.11.2000]
R&D Projects: GA AV ČR IAA1050901; GA MŠMT OC 518.10
Keywords : charge mobility * polysilicon * dipoles
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Permanent Link: http://hdl.handle.net/11104/0084184 - 2.0188007 - UMCH-V 20000047 RIV NL eng J - Journal Article
Nešpůrek, Stanislav - Herden, V. - Kunst, M. - Schnabel, W.
Microwave photoconductivity and polaron formation in poly(methyl(phenyl)silylene).
Synthetic Metals. Roč. 109, 1-3 (2000), s. 309-313. ISSN 0379-6779. E-ISSN 0379-6779.
[International Conference on Electrical and Related Properties of Organic Solids /8./. Szklarska Poreba, 26.06.1999-30.06.1999]
R&D Projects: GA AV ČR IAA1050901; GA AV ČR KSK2050602
Institutional research plan: CEZ:AV0Z4050913
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 0.802, year: 2000
Permanent Link: http://hdl.handle.net/11104/0002456 - 3.0049010 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Horák, Petr - Schauer, Petr
Poly [Methyl (Phenyl) Silylene] LED Diodes – as Seen by Cathodoluminescence Study.
[LED diody na bázi poly[fenyl(methyl)silylenu] z hlediska katodoluminiscenčního studia.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 23-24. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA AV ČR IAA100100622
Institutional research plan: CEZ:AV0Z20650511
Keywords : Poly[Methyl(Phenyl)Silylene] * cathodoluminescence * LED * degradation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139507