Search results
- 1.0575442 - ÚPT 2024 GB eng A - Abstract
Hotz, M. T. - Martis, J. - Radlička, Tomáš - Bacon, N. J. - Dellby, N. - Lovejoy, T. C. - Quillin, S. C. - Hwang, H. Y. - Singh, P. - Křivánek, O. L.
Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 2064-2065. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
Institutional support: RVO:68081731
https://academic.oup.com/mam/article/29/Supplement_1/2064/7228064
Permanent Link: https://hdl.handle.net/11104/0345233 - 2.0575427 - ÚPT 2024 RIV GB eng A - Abstract
Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna Mikmeková, Eliška
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
R&D Projects: GA ČR(CZ) GA22-34286S
Grant - others:AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy (SLEEM) * time-of-flight spectroscopy * graphene
OECD category: Electrical and electronic engineering
https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038
Permanent Link: https://hdl.handle.net/11104/0345212 - 3.0575395 - ÚPT 2024 GB eng A - Abstrakt
Hrubanová, Kamila - Sikorová, Pavlína - Mrázová, Kateřina - Nebesářová, Jana - Obruča, S. - Krzyžánek, Vladislav
Morphological Study of PHA Producing Bacteria.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 883-884. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
Grant CEP: GA MŠMT(CZ) LM2023050
Grant ostatní: AV ČR(CZ) MSM100652102
Program: Program na podporu mezinárodní spolupráce začínajících výzkumných pracovníků
Institucionální podpora: RVO:68081731 ; RVO:60077344
https://academic.oup.com/mam/article/29/Supplement_1/883/7228824
Trvalý link: https://hdl.handle.net/11104/0345203 - 4.0575394 - ÚPT 2024 GB eng A - Abstract
Krzyžánek, Vladislav - Šlouf, Miroslav - Skoupý, Radim - Pavlova, Ewa - Hrubanová, Kamila
Powder Nano-Beam Diffraction in Scanning Electron Microscopy: Possibilities and Limitations for Applications.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 328-329. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
R&D Projects: GA ČR(CZ) GA21-13541S; GA TA ČR(CZ) TN02000020
Institutional support: RVO:68081731 ; RVO:61389013
https://academic.oup.com/mam/article/29/Supplement_1/328/7228371
Permanent Link: https://hdl.handle.net/11104/0345202 - 5.0575309 - ÚPT 2024 GB eng A - Abstract
Ambrož, Ondřej - Jozefovič, Patrik - Čermák, Jan - Mikmeková, Šárka
Effect of Metallographic Pretreatment of TRIP Steel Specimens on Correlative Imaging and Electron Backscatter Diffraction Analysis.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 2023-2025. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
R&D Projects: GA TA ČR(CZ) TN02000020
Grant - others:AV ČR(CZ) LQ100652201
Program: Prémie Lumina quaeruntur
Institutional support: RVO:68081731
Keywords : metallographic pretreatment * TRIP steel * correlative microscopy * EBSD
OECD category: Materials engineering
https://academic.oup.com/mam/article/29/Supplement_1/2023/7228093
Permanent Link: https://hdl.handle.net/11104/0345092 - 6.0575308 - ÚPT 2024 GB eng A - Abstract
Čermák, Jan - Ambrož, Ondřej - Zouhar, Martin - Jozefovič, Patrik - Mikmeková, Šárka
Methodology for Collecting and Aligning Correlative SEM, CLSM and LOM Images of Bulk Material Microstructure to Create a Large Machine Learning Training Dataset.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 2016-2018. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
R&D Projects: GA TA ČR(CZ) TN02000020
Grant - others:AV ČR(CZ) LQ100652201
Program: Prémie Lumina quaeruntur
Institutional support: RVO:68081731
Keywords : correlative microscopy * metalography * specimen navigation * image registration * machine learning dataset
OECD category: Materials engineering
https://academic.oup.com/mam/article/29/Supplement_1/2016/7228070
Permanent Link: https://hdl.handle.net/11104/0345091 - 7.0575302 - ÚPT 2024 GB eng A - Abstract
Jozefovič, Patrik - Ambrož, Ondřej - Čermák, Jan - Man, Jiří - Mikmeková, Šárka
A Comparison of Image Analysis Tools for Segmentation on SEM Micrographs - Zeiss ZEN Intellesis vs. Thermofisher AVIZO.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1889-1891. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
Grant - others:AV ČR(CZ) LQ100652201
Program: Prémie Lumina quaeruntur
Institutional support: RVO:68081731 ; RVO:68081723
Keywords : machine learning * image analysis * segmentation * metalography * scanning electron microscopy
OECD category: Materials engineering
https://academic.oup.com/mam/article/29/Supplement_1/1889/7228906
Permanent Link: https://hdl.handle.net/11104/0345089