0553256 - ÚPT 2022 RIV US eng C - Conference Paper (international conference)
Allaham, Mohammad M. - Buchner, P. - Schreiner, R. - Knápek, A. … Total 6 authors
Testing the performance of Murphy-Good plots when applied to current-voltage characteristics of Si field electron emission tips.
International Vacuum Nanoelectronics Conference. In:
2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 140-141. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
R&D Projects: GA MV(CZ) VI20192022147
Institutional support: RVO:68081731
Keywords : Silicon field emission tips * Murphy-Good plot * electron collection efficiency * array characterization parameters * Silicon field enhancement factor
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600690
Permanent Link: http://hdl.handle.net/11104/0328237