Search results
- 1.0574767 - ÚFP 2024 RIV US eng J - Journal Article
Mach, Marek - Psota, Pavel - Žídek, Karel - Mokrý, Pavel
On-chip digital holographic interferometry for measuring wavefront deformation in transparent samples.
Optics Express. Roč. 31, č. 11 (2023), s. 17185-17200. ISSN 1094-4087
R&D Projects: GA MŠMT(CZ) EF16_026/0008390; GA ČR(CZ) GA19-22000S
Institutional support: RVO:61389021
Keywords : on-chip * interferometry * wavefront deformation
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 3.8, year: 2022
Method of publishing: Open access
https://opg.optica.org/oe/fulltext.cfm?uri=oe-31-11-17185&id=530478
Permanent Link: https://hdl.handle.net/11104/0351270 - 2.0572073 - ÚFP 2024 RIV US eng J - Journal Article
Mach, Marek - Stašík, Marek - Kaván, František - Mokrý, Pavel - Lédl, Vít - Psota, Pavel
Subaperture stitching digital holographic microscopy for precise wear volume measurement in tribology.
Applied Optics. Roč. 62, č. 8 (2023), s. 2137-2144. ISSN 1559-128X. E-ISSN 2155-3165
R&D Projects: GA MŠMT(CZ) EF16_026/0008390; GA ČR(CZ) GA19-22000S
Institutional support: RVO:61389021
Keywords : wear * subaperture stitching * tribology
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 1.9, year: 2022
Method of publishing: Limited access
https://opg.optica.org/ao/abstract.cfm?uri=ao-62-8-2137
Permanent Link: https://hdl.handle.net/11104/0342909 - 3.0570342 - ÚFP 2023 RIV ES eng J - Journal Article
Stašík, M. - Kaván, František - Mach, M. - Sedláčková, K. - Kredba, J. - Špína, Michal
Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm Attenuation.
Sensors & Transducers Journal. Roč. 247, č. 8 (2020), s. 8-17. ISSN 2306-8515. E-ISSN 1726-5479
R&D Projects: GA ČR(CZ) GA19-22000S
Institutional support: RVO:61389021
Keywords : microscope * interferometry * phase shifting * Bragg cell
OECD category: Electrical and electronic engineering
Method of publishing: Open access
https://www.sensorsportal.com/HTML/DIGEST/december_2020/Vol_247/P_3191.pdf
Permanent Link: https://hdl.handle.net/11104/0341635 - 4.0555694 - ÚFP 2022 RIV GB eng J - Journal Article
Das, Nirmal Kumar - Kanclíř, Vít - Mokrý, Pavel - Žídek, Karel
Bulk and interface second harmonic generation in the Si3N4 thin films deposited via ion beam sputtering.
Journal of Optics. Roč. 23, č. 2 (2021), č. článku 024003. ISSN 2040-8978. E-ISSN 2040-8986
R&D Projects: GA MŠMT(CZ) EF16_026/0008390; GA ČR(CZ) GA19-22000S
Grant - others:AV ČR(CZ) ERC100431901
Program: ERC-CZ/AV
Institutional support: RVO:61389021
Keywords : silicon nitride * thin films * ellipsometry * second harmonic generation (SHG) * bulk * interface
OECD category: Coating and films
Impact factor: 2.077, year: 2021
Method of publishing: Limited access
https://iopscience.iop.org/article/10.1088/2040-8986/abe450
Permanent Link: http://hdl.handle.net/11104/0330158