Search results
- 1.0582474 - ÚFP 2024 RIV GB eng J - Journal Article
Akhmetov, F. - Milov, I. - Semin, S. - Formisano, F. - Medvedev, Nikita - Sturm, J.M. - Zhakhovsky, V.V. - Makhotkin, I.A. - Kimel, A. - Ackermann, M.
Laser-induced electron dynamics and surface modification in ruthenium thin films.
Vacuum. Roč. 212, June (2023), č. článku 112045. ISSN 0042-207X. E-ISSN 1879-2715
R&D Projects: GA MŠMT(CZ) LM2018114; GA MŠMT LTT17015; GA MŠMT EF16_013/0001552
Grant - others:Ministerstvo školství, mládeže a tělovýchovy - GA MŠk(CZ) LM2018140
Institutional support: RVO:61389021
Keywords : Femtosecond laser damage * Fermi smearing * Pump-probe thermoreflectance * Ruthenium * Thin films * Two-temperature molecular dynamics
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 3.8, year: 2023
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0042207X23002427?via%3Dihub
Permanent Link: https://hdl.handle.net/11104/0350538 - 2.0572145 - FZÚ 2024 RIV GB eng J - Journal Article
Akhmetov, F. - Milov, I. - Semin, S. - Formisano, F. - Medvedev, Nikita - Sturm, J.M. - Zhakhovsky, V.V. - Makhotkin, I.A. - Kimel, A. - Ackermann, M.
Laser-induced electron dynamics and surface modification in ruthenium thin films.
Vacuum. Roč. 212, June (2023), č. článku 112045. ISSN 0042-207X. E-ISSN 1879-2715
R&D Projects: GA MŠMT LTT17015; GA MŠMT(CZ) LM2018114; GA MŠMT EF16_027/0008215
Research Infrastructure: e-INFRA CZ - 90140
Institutional support: RVO:68378271
Keywords : femtosecond laser damage * thin films * Ruthenium * two-temperature molecular dynamics * Fermi smearing * pump-probe thermoreflectance
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 3.8, year: 2023
Method of publishing: Open access
Permanent Link: https://hdl.handle.net/11104/0350362File Download Size Commentary Version Access 0572145.pdf 0 3.2 MB CC Licence Publisher’s postprint open-access - 3.0503529 - ÚFP 2019 RIV US eng J - Journal Article
Makhotkin, I.A. - Milov, I. - Chalupský, J. - Tiedtke, K. - Enkisch, H. - de Vries, G. - Scholze, F. - Siewert, F. - Sturm, J.M. - Nikolaev, K. V. - van de Kruijs, R.W.E. - Smithers, M.A. - van Wolferen, H.A.G.M. - Keim, E.G. - Louis, E. - Jacyna, I. - Jurek, M. - Klinger, D. - Pełka, J.B. - Juha, Libor - Hájková, V. - Vozda, V. - Burian, Tomáš - Saksl, K. - Faatz, B. - Keitel, B. - Plönjes, E. - Schreiber, S. - Toleikis, S. - Loch, R. - Hermann, M. - Strobel, S. - Donker, R. - Mey, T. - Sobierajski, R.
Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold.
Journal of the Optical Society of America. B. Roč. 35, č. 11 (2018), s. 2799-2805. ISSN 0740-3224. E-ISSN 1520-8540
R&D Projects: GA MŠMT(CZ) LM2015083; GA MŠMT LTT17015; GA MŠMT EF16_013/0001552; GA ČR GPP205/11/P712
EU Projects: European Commission(XE) 654148 - LASERLAB-EUROPE
Institutional support: RVO:61389021
Keywords : interaction of femtosecond XUV pulses * single-shot ablation threshold * damage accumulation in thin ruthenium films
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 2.284, year: 2018
https://www.nature.com/articles/s41598-018-36176-8
Permanent Link: http://hdl.handle.net/11104/0295348 - 4.0500161 - ÚFP 2019 RIV US eng J - Journal Article
Milov, I. - Makhotkin, I.A. - Sobierajski, R. - Medvedev, Nikita - Lipp, V. - Chalupský, J. - Sturm, J.M. - Tiedtke, K. - de Vries, G. - Stoermer, M. - Siewert, F. - van de Kruijs, R. - Louis, E. - Jacyna, I. - Jurek, M. - Juha, L. - Hájková, V. - Vozda, V. - Burian, T. - Saksl, K. - Faatz, B. - Keitel, B. - Ploenjes, E. - Schreiber, S. - Toleikis, S. - Loch, R. - Hermann, M. - Strobel, S. - Nienhuys, H.-K. - Gwalt, G. - Mey, T. - Enkisch, H. - Bijkerk, F.
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Optics Express. Roč. 26, č. 15 (2018), s. 19665-19685. ISSN 1094-4087
R&D Projects: GA MŠMT EF16_013/0001552
Institutional support: RVO:61389021
Keywords : molecular-dynamics * threshold measurements * multilayer optics * lattice-dynamics * metal targets * pulse * ablation * spallation * radiation * surface
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 3.561, year: 2018
https://www.osapublishing.org/oe/abstract.cfm?uri=oe-26-15-19665
Permanent Link: http://hdl.handle.net/11104/0292293 - 5.0497873 - FZÚ 2019 RIV US eng J - Journal Article
Makhotkin, I.A. - Milov, I. - Chalupský, Jaromír - Tiedtke, K. - Enkisch, H. - de Vries, G. - Scholze, F. - Siewert, F. - Sturm, J.M. - Nikolaev, K. - van de Kruijs, R.W.E. - Smithers, M.A. - van Wolferen, H.A.G.M. - Keim, E.G. - Louis, E. - Jacyna, I. - Jurek, M. - Klinger, D. - Pelka, J. B. - Juha, Libor - Hájková, Věra - Vozda, Vojtěch - Burian, Tomáš - Saksl, Karel - Faatz, B. - Keitel, B. - Ploenjes, E. - Schreiber, S. - Toleikis, S. - Loch, R. - Hermann, M. - Strobel, S. - Donker, R. - Mey, T. - Sobierajski, R.
Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold.
Journal of the Optical Society of America. B. Roč. 35, č. 11 (2018), s. 2799-2805. ISSN 0740-3224. E-ISSN 1520-8540
R&D Projects: GA ČR(CZ) GA17-05167s; GA MŠMT LG15013; GA ČR(CZ) GA14-29772S
Institutional support: RVO:68378271
Keywords : interaction of femtosecond XUV pulses * single-shot ablation threshold * damage accumulation in thin ruthenium films
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 2.284, year: 2018
Permanent Link: http://hdl.handle.net/11104/0290344 - 6.0492824 - FZÚ 2019 RIV US eng J - Journal Article
Milov, I. - Makhotkin, I.A. - Sobierajski, R. - Medvedev, Nikita - Lipp, V. - Chalupský, Jaromír - Sturm, J.M. - Tiedtke, K. - de Vries, G. - Störmer, M. - Siewert, F. - van de Kruijs, R. - Louis, E. - Jacyna, I. - Jurek, M. - Juha, Libor - Hájková, Věra - Vozda, Vojtěch - Burian, Tomáš - Saksl, K. - Faatz, B. - Keitel, B. - Ploenjes, E. - Schreiber, S. - Toleikis, S. - Loch, R. - Hermann, M. - Strobel, S. - Nienhuys, H.-K. - Gwalt, G. - Mey, T. - Enkisch, H. - Bijkerk, F.
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Optics Express. Roč. 26, č. 15 (2018), s. 19665-19685. ISSN 1094-4087
R&D Projects: GA ČR(CZ) GA17-05167s; GA MŠMT LG15013
Institutional support: RVO:68378271
Keywords : free-electron lasers * XUV mirrors * Ruthenium material * single-shot damage of thin films
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 3.561, year: 2018
Permanent Link: http://hdl.handle.net/11104/0286255