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- 1.0511229 - FZÚ 2020 RIV US eng J - Journal Article
Konečny, M. - Bartošík, M. - Mach, J. - Švarc, V. - Nezval, D. - Piastek, J. - Procházka, P. - Cahlík, Aleš - Šikola, T.
Kelvin probe force microscopy and calculation of charge transport in a graphene/silicon dioxide system at different relative humidity.
ACS Applied Materials and Interfaces. Roč. 10, č. 14 (2018), s. 11987-11994. ISSN 1944-8244. E-ISSN 1944-8252
Institutional support: RVO:68378271
Keywords : graphene * silicon dioxide * KPFM * RH * BET * electron hopping
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 8.456, year: 2018
Method of publishing: Limited access
https://doi.org/10.1021/acsami.7b18041
Permanent Link: http://hdl.handle.net/11104/0301553