Search results
- 1.0479805 - FZÚ 2018 RIV US eng J - Journal Article
Chernova, Ekaterina - Brooks, Christopher D. - Chvostová, Dagmar - Bryknar, Z. - Dejneka, Alexandr - Tyunina, Marina
Optical NIR-VIS-VUV constants of advanced substrates for thin-film devices.
Optical Materials Express. Roč. 7, č. 11 (2017), s. 3844-3862. ISSN 2159-3930
R&D Projects: GA ČR GA15-13778S; GA MŠMT EF15_008/0000162; GA ČR GA15-15123S
Grant - others:ELI Beamlines(XE) CZ.02.1.01/0.0/0.0/15_008/0000162
Institutional support: RVO:68378271
Keywords : ellipsometry * epitaxy * optical properties * single-crystal substrates * thin films
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 2.566, year: 2017
Permanent Link: http://hdl.handle.net/11104/0275735