Search results
- 1.0494421 - ÚFP 2019 RIV CZ cze V - Research Report
Žídek, Karel
Zajištění plošné homogenity při depozici složitých systémů vrstev.
[Attaining surface homogeneity in the deposition of complex layer systems.]
CSL – Centre Spatial de Liège University of Liege, 2018. 7 s.
R&D Projects: GA MŠMT(CZ) LO1206
Institutional support: RVO:61389021
Keywords : thin layer deposition * deposition mask * surface homogeneity
OECD category: Optics (including laser optics and quantum optics)
Permanent Link: http://hdl.handle.net/11104/0287991 - 2.0494420 - ÚFP 2019 RIV CZ cze V - Research Report
Žídek, Karel
Stabilita optického monitoru při depozici 42-vrstvého interferenčního „bandpass“ filtru 520-590 nm.
[Stability of an optical monitor for deposition of 42-layer interference bandpass filter 520-590 nm.]
Turnov: CSL – Centre Spatial de Liège University of Liege, 2018. 7 s.
R&D Projects: GA MŠMT(CZ) LO1206
Institutional support: RVO:61389021
Keywords : thin layer deposition * thickness monitor * interference filter * deposition stability
OECD category: Optics (including laser optics and quantum optics)
Permanent Link: http://hdl.handle.net/11104/0287992 - 3.0490726 - ÚFP 2019 RIV CZ eng V - Research Report
Melich, Radek - Václavík, Jan - Žídek, Karel
Methodology of camera spectral response measurement.
Turnov: ELCOM, a.s., 2016. 3 s.
Institutional support: RVO:61389021
Keywords : Camera spectral response
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0294183 - 4.0473026 - ÚFP 2017 RIV CZ eng V - Research Report
Melich, Radek - Václavík, Jan - Žídek, Karel
Device calibration..
Turnov: ELCOM, a.s., 2016. 3 s.
Source of funding: N - Non-public resources
Keywords : absolute brightness calibration
Subject RIV: JP - Industrial Processing
Permanent Link: http://hdl.handle.net/11104/0270251 - 5.0473025 - ÚFP 2017 RIV CZ eng V - Research Report
Melich, Radek - Václavík, Jan - Žídek, Karel
Selection process of an observation objective with respect to minimal glare level.
Turnov: ELCOM, a.s., 2016. 3 s.
Source of funding: N - Non-public resources
Keywords : objective glare
Subject RIV: JP - Industrial Processing
Permanent Link: http://hdl.handle.net/11104/0270195 - 6.0473020 - ÚFP 2017 RIV CZ eng V - Research Report
Melich, Radek - Václavík, Jan - Žídek, Karel
Measurement of camera spectral response.
Turnov: ELCOM, a.s., 2016. 3 s.
Source of funding: N - Non-public resources
Keywords : Camera spectral response
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0270192