Search results
- 1.0494374 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Rodenburg, C. - Masters, R. - Abrams, K. - Dapor, M. - Krátký, Stanislav - Mika, Filip
Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 68-69. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
Institutional support: RVO:68081731
Keywords : secondary electrons * polymers * hyperspectral imaging
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0288492 - 2.0460212 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Rodenburg, C. - Masters, R. - Lidzey, D. - Unčovský, M. - Vystavěl, Tomáš - Mika, Filip
Secondary electron spectroscopy and energy selective imaging for the engineering of carbon based materials.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 58-59. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
Institutional support: RVO:68081731 ; RVO:68378271
Keywords : emission spectroscopy * SES
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260344