Search results

  1. 1.
    0452283 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
    Krzyžánek, Vladislav - Keller, U. - Sporenberg, N. - Schönhoff, M.
    Structure of polyelectrolyte hollow capsules by scanning electron microscopy.
    12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 211-212. ISBN 978-963-05-9653-4.
    [MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
    R&D Projects: GA ČR(CZ) GA14-20012S
    Institutional support: RVO:68081731
    Keywords : cryo-SEM * low voltage STEM * quantitative imaging * hollow capsules
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0253308
     
     
  2. 2.
    0452276 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
    Skoupý, Radim - Krzyžánek, Vladislav - Kočová, L. - Nebesářová, Jana
    Electron beam induced mass loss dependence on aging of Epon resin sections.
    12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 112-113. ISBN 978-963-05-9653-4.
    [MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
    R&D Projects: GA ČR(CZ) GA14-20012S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731 ; RVO:60077344
    Keywords : STEM * mass loss * resin * Epon
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0253305
     
     
  3. 3.
    0450825 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
    Frank, Luděk - Mikmeková, Eliška
    Graphene examined with very slow electrons.
    12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 182-183. ISBN 978-963-05-9653-4.
    [MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : graphene * 2D crystals * ultra-low-energy STEM * ultra-low-energy SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0252038
     
     
  4. 4.
    0450822 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
    Pokorná, Zuzana - Frank, Luděk - Knápek, Alexandr - Konvalina, Ivo - Mikmeková, Eliška - Mikmeková, Šárka - Walker, Christopher - Müllerová, Ilona
    Scanning low-and very low energy electron microscopy.
    12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 218-220. ISBN 978-963-05-9653-4.
    [MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : very low energy * scanning low energy electron microscopy * crystallography, graphene * tissue sections
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0252034
     
     


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