Search results
- 1.0580021 - ÚFP 2024 RIV US eng J - Journal Article
Makita, M. - Vartiainen, I. - Mohacsi, I. - Caleman, C. - Diaz, A. - Jönsson, K. I. - Juranic, P. - Medvedev, Nikita - Meents, A. - Mozzanica, A. - Opara, N.L. - Padeste, C. - Panneels, V. - Saxena, V. - Sikorski, M. - Song, S. - Vera, L. - Willmott, P. R. - Beaud, P. - Milne, C. J. - Ziaja-Motyka, B. - David, C.
Femtosecond phase-transition in hard x-ray excited bismuth.
Scientific Reports. Roč. 9, č. 1 (2019), č. článku 602. ISSN 2045-2322. E-ISSN 2045-2322
R&D Projects: GA MŠMT LTT17015; GA MŠMT(CZ) LM2015083
Institutional support: RVO:61389021
Keywords : femtosecond * x-ray * bismuth
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 3.998, year: 2019
Method of publishing: Open access
https://www.nature.com/articles/s41598-018-36216-3
Permanent Link: https://hdl.handle.net/11104/0348827 - 2.0505015 - FZÚ 2020 RIV GB eng J - Journal Article
Makita, M. - Vartiainen, I. - Mohacsi, I. - Caleman, C. - Diaz, A. - Jonsson, H.O. - Juranic, P. - Medvedev, Nikita - Meents, A. - Mozzanica, A. - Opara, N.L. - Padeste, C. - Panneels, V. - Saxena, V. - Sikorski, M. - Song, S. - Vera, L. - Willmott, P. R. - Beaud, P. - Milne, C. J. - Ziaja-Motyka, B. - David, C.
Femtosecond phase-transition in hard x-ray excited bismuth.
Scientific Reports. Roč. 9, Jan (2019), s. 1-7, č. článku 602. ISSN 2045-2322. E-ISSN 2045-2322
EU Projects: European Commission(XE) 654148 - LASERLAB-EUROPE
Institutional support: RVO:68378271
Keywords : hard x-ray excitation in bismuth single crystal * femtsosecond phase-transition * electron-ion equilibration process
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 3.998, year: 2019
Method of publishing: Open access
Permanent Link: http://hdl.handle.net/11104/0296542File Download Size Commentary Version Access 0505015.pdf 7 1.4 MB CC licence Publisher’s postprint open-access - 3.0434183 - FZÚ 2015 RIV US eng J - Journal Article
Lovric, G. - Oberta, Peter - Mohacsi, I. - Stampanoni, M. - Mokso, R.
A robust tool for photon source geometry measurements using the fractional Talbot effect.
Optics Express. Roč. 22, č. 3 (2014), s. 2745-2760. ISSN 1094-4087
Institutional support: RVO:68378271
Keywords : hard X-rays * X-ray imaging * Talbot and self-imaging effects * synchrotron radiation
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 3.488, year: 2014
http://www.opticsinfobase.org/oe/search2.cfm?reissue=J&journalList=4&fullrecord=oberta&basicsearch=Go
Permanent Link: http://hdl.handle.net/11104/0238308