Search results

  1. 1.
    0574279 - ÚPT 2024 RIV NL eng J - Journal Article
    Průcha, Lukáš - Lejeune, M. - Kizovský, Martin - Materna Mikmeková, Eliška
    In-situ thermal Raman spectroscopy of single-layer graphene on different substrates.
    Materials Today Communications. Roč. 35, June (2023), č. článku 105921. ISSN 2352-4928. E-ISSN 2352-4928
    R&D Projects: GA ČR(CZ) GA22-34286S
    Institutional support: RVO:68081731
    Keywords : Graphene * Raman spectroscopy * Thermal measurements * Graphene decomposition * Thermal decomposition
    OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
    Impact factor: 3.8, year: 2022
    Method of publishing: Limited access
    https://www.sciencedirect.com/science/article/pii/S2352492823006128
    Permanent Link: https://hdl.handle.net/11104/0344614
     
     
  2. 2.
    0532408 - ÚPT 2021 RIV GB eng J - Journal Article
    Pérez-Pacheco, A. - García, E. - Calderón-Olvera, R. M. - Muhl, S. - Camps, E. - Lejeune, M. - Mikmeková, Eliška
    Nanocomposite films of a-C:H/Bi made using a toroidal planar hollow cathode.
    FlatChem. Roč. 20, MAR (2020), č. článku 100160. ISSN 2452-2627. E-ISSN 2452-2627
    Institutional support: RVO:68081731
    Keywords : hollow cathode * nanoparticles * amorphous carbon * bismuth
    OECD category: Coating and films
    Impact factor: 5.227, year: 2020
    Method of publishing: Limited access
    https://www.sciencedirect.com/science/article/abs/pii/S245226272030009X
    Permanent Link: http://hdl.handle.net/11104/0310909
     
     
  3. 3.
    0525529 - ÚPT 2021 RIV NL eng J - Journal Article
    Materna Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
    Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
    Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
    OECD category: Electrical and electronic engineering
    Impact factor: 1.957, year: 2020
    Method of publishing: Open access
    https://www.sciencedirect.com/science/article/pii/S0368204818302068
    Permanent Link: http://hdl.handle.net/11104/0309642
     
     
  4. 4.
    0474781 - ÚPT 2018 RIV NL eng J - Journal Article
    Frank, Luděk - Mikmeková, Eliška - Lejeune, M.
    Treatment of surfaces with low-energy electrons.
    Applied Surface Science. Roč. 407, JUN 15 (2017), s. 105-108. ISSN 0169-4332. E-ISSN 1873-5584
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : Low-energy electrons * Electron beam induced release * Graphene * Ultimate cleaning of surfaces
    OECD category: Nano-processes (applications on nano-scale)
    Impact factor: 4.439, year: 2017
    Permanent Link: http://hdl.handle.net/11104/0271732
     
     
  5. 5.
    0469631 - ÚFE 2017 RIV CA eng J - Journal Article
    Mhamdi, L. - Mhamdi, N. - Mhamdi, Nc. - Lejeune, M. - Jaffrezic, N. - Burais, N. - Scorretti, R. - Pokorný, Jiří - Ponsonnet, L.
    Effect of a static magnetic field on Escherichia coli adhesion and orientation.
    Canadian Journal of Microbiology. Roč. 62, č. 11 (2016), s. 944-952. ISSN 0008-4166. E-ISSN 1480-3275
    Institutional support: RVO:67985882
    Keywords : Fluorescence microscopy * Static magnetic field * Escherichia coli
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.462, year: 2016
    Permanent Link: http://hdl.handle.net/11104/0267455
     
     
  6. 6.
    0459573 - ÚPT 2017 RIV CH eng J - Journal Article
    Mikmeková, Eliška - Frank, Luděk - Müllerová, Ilona - Li, B. W. - Ruoff, R. S. - Lejeune, M.
    Study of multi-layered graphene by ultra-low energy SEM/STEM.
    Diamond and Related Materials. Roč. 63, March 2016 (2016), s. 136-142. ISSN 0925-9635. E-ISSN 1879-0062
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : scanning ultra low energy electron microscopy * graphene * contamination * CVD
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.561, year: 2016
    Permanent Link: http://hdl.handle.net/11104/0259759
     
     
  7. 7.
    0443322 - ÚPT 2016 RIV US eng J - Journal Article
    Frank, Luděk - Mikmeková, Eliška - Müllerová, Ilona - Lejeune, M.
    Counting graphene layers with very slow electrons.
    Applied Physics Letters. Roč. 106, 09 JAN (2015), 013117:1-5. ISSN 0003-6951. E-ISSN 1077-3118
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : graphene * ultralow energy STEM * counting graphene layers * cleaning of graphene * 2D crystals
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 3.142, year: 2015
    Permanent Link: http://hdl.handle.net/11104/0246044
     
     
  8. 8.
    0395127 - ÚPT 2014 RIV GB eng J - Journal Article
    Mikmeková, Eliška - Bouyanfif, H. - Lejeune, M. - Müllerová, Ilona - Hovorka, Miloš - Unčovský, M. - Frank, Luděk
    Very low energy electron microscopy of graphene flakes.
    Journal of Microscopy. Roč. 251, č. 2 (2013), s. 123-127. ISSN 0022-2720. E-ISSN 1365-2818
    R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : graphene * very low energy STEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.150, year: 2013
    Permanent Link: http://hdl.handle.net/11104/0225233
     
     


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