Search results
- 1.0379919 - ÚPT 2013 RIV AU eng C - Conference Paper (international conference)
Neděla, Vilém - Konvalina, Ivo - Lencová, B. - Zlámal, J. - Jirák, J.
New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 370:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : environmental scanning electron microscope * detection systems * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210770 - 2.0379918 - ÚPT 2013 RIV AU eng C - Conference Paper (international conference)
Pokorná, Zuzana - Mikmeková, Šárka - Matsuda, K. - Müllerová, Ilona - Frank, Luděk
Backscattered electrons in examination of materials.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 940:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : scanning electron microscope * backscattered electrons * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210769 - 3.0379917 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk
Very Low Energy STEM and Imaging of Free-standing Foils.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 411:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy * cathode lens * transmitted electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210768 - 4.0379916 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Müllerová, Ilona - Konvalina, Ivo - Hovorka, Miloš - Mika, Filip
Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 410:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning electron microscopy * cathode lens * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210767 - 5.0379915 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Müllerová, Ilona - Mikmeková, Šárka - Matsuda, K. - Mikmeková, Eliška - Ikeno, S. - Shiojiri, M.
SLEEM and its Applications in Material Research.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 409: 1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210766