Search results

  1. 1.
    0503529 - ÚFP 2019 RIV US eng J - Journal Article
    Makhotkin, I.A. - Milov, I. - Chalupský, J. - Tiedtke, K. - Enkisch, H. - de Vries, G. - Scholze, F. - Siewert, F. - Sturm, J.M. - Nikolaev, K. V. - van de Kruijs, R.W.E. - Smithers, M.A. - van Wolferen, H.A.G.M. - Keim, E.G. - Louis, E. - Jacyna, I. - Jurek, M. - Klinger, D. - Pełka, J.B. - Juha, Libor - Hájková, V. - Vozda, V. - Burian, Tomáš - Saksl, K. - Faatz, B. - Keitel, B. - Plönjes, E. - Schreiber, S. - Toleikis, S. - Loch, R. - Hermann, M. - Strobel, S. - Donker, R. - Mey, T. - Sobierajski, R.
    Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold.
    Journal of the Optical Society of America. B. Roč. 35, č. 11 (2018), s. 2799-2805. ISSN 0740-3224. E-ISSN 1520-8540
    R&D Projects: GA MŠMT(CZ) LM2015083; GA MŠMT LTT17015; GA MŠMT EF16_013/0001552; GA ČR GPP205/11/P712
    EU Projects: European Commission(XE) 654148 - LASERLAB-EUROPE
    Institutional support: RVO:61389021
    Keywords : interaction of femtosecond XUV pulses * single-shot ablation threshold * damage accumulation in thin ruthenium films
    OECD category: Optics (including laser optics and quantum optics)
    Impact factor: 2.284, year: 2018
    https://www.nature.com/articles/s41598-018-36176-8
    Permanent Link: http://hdl.handle.net/11104/0295348
     
     
  2. 2.
    0449053 - FZÚ 2016 RIV US eng J - Journal Article
    Aquila, A. - Sobierajski, R. - Ozkan, C. - Hájková, Věra - Burian, Tomáš - Chalupský, Jaromír - Juha, Libor - Störmer, M. - Bajt, S. - Klepka, M.T. - Dlužewski, P. - Morawiec, K. - Ohashi, H. - Koyama, T. - Tono, K. - Inubushi, Y. - Yabashi, M. - Sinn, H. - Tschentscher, T. - Mancuso, A.P. - Gaudin, J.
    Fluence thresholds for grazing incidence hard x-ray mirrors.
    Applied Physics Letters. Roč. 106, č. 24 (2015), "241905-1"-"241905-5". ISSN 0003-6951. E-ISSN 1077-3118
    R&D Projects: GA ČR(CZ) GA14-29772S
    Grant - others:AVČR(CZ) M100101221
    Institutional support: RVO:68378271
    Keywords : XFEL * Free Electron Laser * damage threshold * X-ray optics
    Subject RIV: BH - Optics, Masers, Lasers
    Impact factor: 3.142, year: 2015
    Permanent Link: http://hdl.handle.net/11104/0250641
     
     
  3. 3.
    0362892 - FZÚ 2012 RIV US eng J - Journal Article
    Galtier, E. - Rosmej, F.B. - Dzelzainis, T. - Riley, D. - Khattak, F.Y. - Heimann, P. - Lee, R. W. - Nelson, A.J. - Vinko, S.M. - Whitcher, T. - Wark, J. S. - Tschentscher, T. - Toleikis, S. - Fäustlin, R.R. - Sobierajski, R. - Jurek, M. - Juha, Libor - Chalupský, Jaromír - Hájková, Věra - Kozlová, Michaela - Krzywinski, J. - Nagler, B.
    Decay of cystalline order and equilibration during the solid-to-plasma transition induced by 20-fs microfocused 92-eV free-electron-laser pulses.
    Physical Review Letters. Roč. 106, č. 16 (2011), "164801-1"-"164801-4". ISSN 0031-9007. E-ISSN 1079-7114
    R&D Projects: GA ČR GAP208/10/2302; GA MŠMT LA08024; GA AV ČR IAAX00100903; GA MŠMT(CZ) ME10046
    Institutional research plan: CEZ:AV0Z10100523
    Keywords : X-ray lasers * free-electron lasers * X-ray emission spectroscopy
    Subject RIV: BH - Optics, Masers, Lasers
    Impact factor: 7.370, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0199067
     
     


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