Search results
- 1.0352197 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Číp, Ondřej - Čížek, Martin - Buchta, Zdeněk - Mikel, Břetislav - Lazar, Josef - Hrabina, Jan
Laser Measuring Gauge for Precise Transducer Calibrations in Nanometric Scale.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 582: 1-5. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA MŠMT(CZ) LC06007; GA AV ČR KAN311610701; GA MPO FR-TI1/241; GA ČR GA102/09/1276; GA ČR GAP102/10/1813
Institutional research plan: CEZ:AV0Z20650511
Keywords : nanometrology * sensors * distance measurements * measuring gauge
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191767 - 2.0352196 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Lazar, Josef - Číp, Ondřej - Čížek, Martin - Hrabina, Jan - Šerý, Mojmír
Interferometer Controlled Positioning for Nanometrology.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 525: 1-5. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA MŠMT(CZ) LC06007; GA AV ČR KAN311610701; GA MPO FR-TI1/241; GA ČR GA102/09/1276
Institutional research plan: CEZ:AV0Z20650511
Keywords : atomic force microscopy * interferometer controlled positioning
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191766 - 3.0352195 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Buchta, Zdeněk - Mikel, Břetislav - Lazar, Josef - Číp, Ondřej
Surface Diagnostics using Low-Coherence Interferometry and Colour Single CCD Camera.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 517: 1-6. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA ČR GP102/09/P293; GA ČR GP102/09/P630; GA MPO 2A-1TP1/127; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LC06007
Institutional research plan: CEZ:AV0Z20650511
Keywords : low-coherence interferometry * surface diagnostics * CCD camera * white-light fringe analysis
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191765 - 4.0352194 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Hrabina, Jan - Lazar, Josef - Číp, Ondřej - Čížek, Martin
Laser Source for Interferometry in Nanometrology.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 541: 1-6. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA MŠMT(CZ) LC06007; GA MŠMT 2C06012; GA MPO 2A-1TP1/127; GA MPO FT-TA3/133; GA MPO 2A-3TP1/113; GA ČR GA102/09/1276; GA ČR GA102/07/1179
Institutional research plan: CEZ:AV0Z20650511
Keywords : nanometrology * AFM microscopy * interferometry
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191764 - 5.0352188 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Mikel, Břetislav - Buchta, Zdeněk - Lazar, Josef - Číp, Ondřej
DFB Laser Source at 760 nm Wavelength for Nanometrology.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 277: 1-8. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA MPO 2A-1TP1/127; GA MŠMT ED0017/01/01; GA ČR GP102/09/P293; GA ČR GP102/09/P630
Institutional research plan: CEZ:AV0Z20650511
Keywords : DFB laser diode * nanometrology * stabilization * tuneability
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191760