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- 1.0351779 - ÚFE 2011 RIV RU eng J - Journal Article
Lomov, A. A. - Punegov, V. I. - Vasil'ev, A. L. - Nohavica, Dušan - Gladkov, Petar - Kartsev, A. A. - Novikov, D. V.
X-ray diffraction analysis of multilayer porous InP(001) structure.
Crystallography Reports. Roč. 55, č. 2 (2010), s. 182-190. ISSN 1063-7745. E-ISSN 1562-689X
Institutional research plan: CEZ:AV0Z20670512
Keywords : silicon layers * INP
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.644, year: 2010
Permanent Link: http://hdl.handle.net/11104/0191457