Search results
- 1.0436000 - ÚFE 2015 RIV GB eng J - Journal Article
Lomov, A. A. - Punegov, V. I. - Nohavica, Dušan - Chuev, M.A. - Vasiliev, A.L. - Novikov, D. V.
High-resolution synchrotron diffraction study of porous buffer InP(001) layers.
Journal of Applied Crystallography. Roč. 47, č. 5 (2014), s. 1614-1625. ISSN 0021-8898. E-ISSN 1600-5767
Institutional support: RVO:67985882
Keywords : porous layers * X-ray reciprocal space mapping * indium phosphide
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 3.984, year: 2014
Permanent Link: http://hdl.handle.net/11104/0239828File Download Size Commentary Version Access UFE 0436000.pdf 1 897.7 KB Other require - 2.0351779 - ÚFE 2011 RIV RU eng J - Journal Article
Lomov, A. A. - Punegov, V. I. - Vasil'ev, A. L. - Nohavica, Dušan - Gladkov, Petar - Kartsev, A. A. - Novikov, D. V.
X-ray diffraction analysis of multilayer porous InP(001) structure.
Crystallography Reports. Roč. 55, č. 2 (2010), s. 182-190. ISSN 1063-7745. E-ISSN 1562-689X
Institutional research plan: CEZ:AV0Z20670512
Keywords : silicon layers * INP
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.644, year: 2010
Permanent Link: http://hdl.handle.net/11104/0191457