Search results
- 1.0350672 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Zobačová, Jitka - Mikmeková, Šárka - Polčák, J. - Frank, Luděk
Imaging of thermal treated thin films on silicon substrate in the scanning low energy electron microscope.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 69-70. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : thin films * SLEEM * Si substrate
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350672_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190612 - 2.0350671 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Urbánek, Michal - Kolařík, Vladimír - Král, Stanislav - Dvořáková, Marie
Determination of proximity effect forward scattering range parameter in e-beam lithography.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 67-68. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA MPO FR-TI1/576; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron beam lithography * proximity effect
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350671_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190611 - 3.0350670 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš
Properties of Bi LMIS with ion clusters.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 57-58. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
Grant - others:EC 7FP(XE) NMP4-SE-2008-200613
Institutional research plan: CEZ:AV0Z20650511
Source of funding: R - Framework programmes of European Commission
Keywords : SIMS * liquid–metal ion sources (LMIS) * discrete coulomb interactions (DCI)
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350670_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190610 - 4.0350669 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk
Mapping the local density of states above vacuum level by very low energy electron reflectivity.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 53-54. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
Institutional research plan: CEZ:AV0Z20650511
Keywords : local density of states * scanning tunneling spectroscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350669_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190609 - 5.0350668 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin
Ray tracing, aberration coefficients and intensity distribution.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 49-52. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : ray tracing * aberration coefficients * intensity distribution
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350668_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190608 - 6.0350667 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
Transmission mode in scanning low enery electron microscope.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 41-42. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : cathode lens * SEM * transmitted electron mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350667_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190607 - 7.0350665 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Mikmeková, Šárka - Hovorka, Miloš - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
Prospects of the scanning low energy electron microscopy in materials science.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 37-38. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * scanning electron microscopy * transmission electron microscopy * focused ion beam microscopy * cathode lens mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350665_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190605 - 8.0350664 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Mika, Filip - Hovorka, Miloš - Frank, Luděk
Imaging of dopants under presence of surface ad-layers.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 35-36. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA ČR GP102/09/P543
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * semiconductor structures * image contrast * dopant concentration * secondary electron emission
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350664_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190604 - 9.0350663 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Matsuda, K. - Mizutani, M. - Nishimura, K. - Kawabata, T. - Hishinuma, Y. - Aoyama, S. - Müllerová, Ilona - Frank, Luděk - Ikeno, S.
Superconductive property and microstructure of MgB2/Al composite materials.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 33-34. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * SLEEM * microstructure contrast * composite materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350663_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190603 - 10.0350662 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Matějka, Milan - Rek, Antonín - Mika, Filip - Fořt, Tomáš - Matějková, Jiřina
Comparison of techniques for diffraction grating topography analysis.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 29-32. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
Institutional research plan: CEZ:AV0Z20650511
Keywords : Atomic Force Microscopy * AEM * Scanning Electron Microscopy * SEM * topography imaging
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350662_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190602