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- 1.0353265 - ÚPT 2011 JP eng A - Abstract
Mikmeková, Šárka - Matsuda, K. - Kawabata, T. - Mizutani, M. - Watanabe, K. - Müllerová, Ilona - Frank, Luděk
Benefits of the Scanning Low Energy Electron Microscopy to Examination of Advanced Materials.
2010 Fall Annual Meeting of The Japan Institute of Metals. Hokkaido: Hokkaido University, 2010. s. 248.
[2010 Fall Annual Meeting of The Japan Institute of Metals. 25.09.2010-29.09.2010, Hokkaido]
Institutional research plan: CEZ:AV0Z20650511
Keywords : SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192557