Search results
- 1.0580588 - ÚPT 2024 RIV CH eng J - Journal Article
Šabacká, P. - Maxa, Jiří - Bayer, R. - Binar, T. - Bača, P. - Dostalová, P. - Mačák, M. - Čudek, P.
Comparative Analysis of Supersonic Flow in Atmospheric and Low Pressure in the Region of Shock Waves Creation for Electron Microscopy.
Sensors. Roč. 23, č. 24 (2023), č. článku 9765. E-ISSN 1424-8220
R&D Projects: GA ČR(CZ) GA22-25799S
Institutional support: RVO:68081731
Keywords : Ansys Fluent * critical flow * ESEM * nozzle * one-dimensional flow theory * pressure sensors * sensing techniques for low pressures * temperature sensors
OECD category: Electrical and electronic engineering
Impact factor: 3.9, year: 2022
Method of publishing: Open access
https://www.mdpi.com/1424-8220/23/24/9765
Permanent Link: https://hdl.handle.net/11104/0349352 - 2.0549311 - ÚPT 2022 RIV CH eng J - Journal Article
Šimonová, L. - Matějka, Milan - Knápek, Alexandr - Králík, Tomáš - Pokorná, Zuzana - Mika, Filip - Fořt, Tomáš - Man, O. - Škarvada, P. - Otáhal, A. - Čudek, P.
Nanostructures for achieving selective properties of a thermophotovoltaic emitter.
Nanomaterials. Roč. 11, č. 9 (2021), č. článku 2443. E-ISSN 2079-4991
Institutional support: RVO:68081731
Keywords : thermophotovoltaics * selective emitters * nanostructures * reactive ion etching * emissivity * electron beam lithography
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 5.719, year: 2021
Method of publishing: Open access
https://www.mdpi.com/2079-4991/11/9/2443
Permanent Link: http://hdl.handle.net/11104/0325334 - 3.0434469 - ÚPT 2015 RIV US eng J - Journal Article
Čudek, P. - Jirák, Josef - Neděla, Vilém
Optimization of Signal Detection in Scintillation Secondary Electron Detector for ESEM and SEM.
Microscopy and Microanalysis. Roč. 19, S2 (2014), s. 40-41. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103; GA ČR(CZ) GA14-22777S
Institutional support: RVO:68081731
Keywords : signal detection * scintillation secondary electron detector * ESEM * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0238537 - 4.0383890 - ÚPT 2013 RIV US eng J - Journal Article
Jirák, Josef - Čudek, P. - Neděla, Vilém
Scintillation secondary electron detector for ESEM and SEM.
Microscopy and Microanalysis. Roč. 18, Suppl. 2 (2012), s. 1266-1267. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : environmental scanning electron microscopes * scintillation detector * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.495, year: 2012
Permanent Link: http://hdl.handle.net/11104/0213687 - 5.0368932 - ÚPT 2012 RIV US eng J - Journal Article
Jirák, J. - Čudek, P. - Neděla, Vilém
Detection of Secondary Electrons by Scintillation Detector at VP SEM.
Microscopy and Microanalysis. Roč. 17, Suppl. 2 (2011), s. 922-923. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : variable pressure scanning electron microscopes (VP-SEM) * scintillation detector * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 3.007, year: 2011
Permanent Link: http://hdl.handle.net/11104/0203133 - 6.0350812 - ÚPT 2011 RIV GB eng J - Journal Article
Jirák, J. - Neděla, Vilém - Černoch, P. - Čudek, P. - Runštuk, Jiří
Scintillation SE detector for variable pressure scanning electron microscopes.
Journal of Microscopy. Roč. 239, č. 3 (2010), s. 233-238. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : scintillation detector * secondary electrons detection * variable pressure scanning electron
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2010
Permanent Link: http://hdl.handle.net/11104/0190715