Search results
- 1.0353046 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Jirák, J. - Čudek, P. - Neděla, Vilém
Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I10.14: 1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : VPSEM * scintillation detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192396 - 2.0335269 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Runštuk, Jiří - Neděla, Vilém - Čudek, P. - Jirák, J.
In-situ observation of salt crystallization using environmental scanning electron microscopy.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 225-226. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
Institutional research plan: CEZ:AV0Z20650511
Keywords : crystallization * in-situ study * environmental SEM * salt
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/97905.pdf
Permanent Link: http://hdl.handle.net/11104/0179778 - 3.0335266 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Čudek, P. - Jirák, Josef - Neděla, Vilém
Scintillation secondary electron detector for variable pressure scanning electron microscope.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 221-222. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
Institutional research plan: CEZ:AV0Z20650511
Keywords : scintillation SE detector * variable pressure SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/95710.pdf
Permanent Link: http://hdl.handle.net/11104/0179776