Search results
- 1.0567105 - FZÚ 2023 RIV eng P - Patent Document
Nejdl, Jaroslav - Albrecht, Martin - Vančura, Jakub
Device, use of the device and a method for high-contrasting imaging.
2022. Owner: Fyzikální ústav AV ČR, v. v. i. Date of the patent acceptance: 05.04.2022. Patent Number: US11293864B2
Institutional support: RVO:68378271
Keywords : contrast imaging * beam splitting * beam divergence
OECD category: Particles and field physics
https://worldwide.espacenet.com/patent/search/family/066530386/publication/US11293864B2?q=US11293864
Permanent Link: https://hdl.handle.net/11104/0338372 - 2.0552955 - FZÚ 2022 RIV eng P - Patent Document
Nejdl, Jaroslav
Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof.
2021. Owner: Fyzikální ústav AV ČR, v. v. i. Date of the patent acceptance: 09.02.2021. Patent Number: US10914628B2
R&D Projects: GA MŠMT EF16_019/0000789; GA MŠMT(CZ) LM2018141
Grant - others:OP VVV - ADONIS(XE) CZ.02.1.01/0.0/0.0/16_019/0000789
Institutional support: RVO:68378271
Keywords : spectrometry * beam intensity profile diagnostics * XUV * X-rays
OECD category: Fluids and plasma physics (including surface physics)
https://worldwide.espacenet.com/patent/search/family/060327011/publication/US10914628B2?q=US10914628B2
Permanent Link: http://hdl.handle.net/11104/0328013 - 3.0545622 - FZÚ 2022 RIV cze P - Patent Document
Nejdl, Jaroslav
Kompaktní systém pro charakterizaci spektra a profilu intenzity svazku krátkovlnného záření.
[A compact system for characterizing the spectrum and intensity profile of shortwave radiation beams.]
2018. Owner: Fyzikální ústav AV ČR v. v. i. Date of the patent acceptance: 14.02.2018. Patent Number: 307169
R&D Projects: GA MŠMT EF15_008/0000162
Grant - others:ELI Beamlines(XE) CZ.02.1.01/0.0/0.0/15_008/0000162
Institutional support: RVO:68378271
Keywords : spektrometrie * diagnostika profilu svazku * XUV * měkké RTG záření
OECD category: Fluids and plasma physics (including surface physics)
https://isdv.upv.cz/doc/FullFiles/Patents/FullDocuments/307/307169.pdf
Permanent Link: http://hdl.handle.net/11104/0322301 - 4.0536283 - FZÚ 2021 RIV eng P - Patent Document
Nejdl, Jaroslav - Albrecht, Martin - Vančura, J.
A device, use of the device and a method for high-contrast imaging.
2020. Owner: Fyzikální ústav AV ČR, v. v. i. Date of the patent acceptance: 18.09.2020. Patent Number: LU101150
R&D Projects: GA MŠMT LQ1606
Institutional support: RVO:68378271
Keywords : vysoký kontrast * metrologie * optické sondování
OECD category: Optics (including laser optics and quantum optics)
https://lu.espacenet.com/publicationDetails/originalDocument?CC=LU&NR=101150B1&KC=B1&FT=D&ND=3&date=20200918&DB=EPODOC&locale=fr_LU#
Permanent Link: http://hdl.handle.net/11104/0315036